Integrated circuits - Very large scale integration - Testing - Congresses.
Overview
| Works: | 7 works in 6 publications in 6 languages | |
|---|---|---|
Titles
14th IEEE VLSI Test Symposium : = April 28-May 1, 1996, Princeton, New Jersey : proceedings /
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(Language materials, printed)
VLSI design and test = 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017 : revised selected papers /
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(Electronic resources)
VLSI design and test = 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018 : revised selected papers /
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(Electronic resources)
Vlsi design and test = 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022 : revised selected papers /
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(Electronic resources)
Emerging VLSI devices, circuits and architectures = proceedings of the 27th International Symposium, VDAT 2023 /
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(Electronic resources)
VLSI for embedded intelligence = proceedings of the 27th International Symposium, VDAT 2023 /
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(Electronic resources)
Subjects