Semiconductors - Testing.

Semiconductor material and device characterization / by: (Language materials, printed)

Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis / by: (Language materials, printed)

Semiconductor material and device characterization / by: (Language materials, printed)

Semiconductor material and device characterization / by: (Language materials, printed)

X-ray absorption spectroscopy of semiconductors by: (Electronic resources)

Semiconductors.

X-ray spectroscopy.

Metals- Surfaces

X-rays- Industrial applications.

Optics and Electrodynamics.

Applied and Technical Physics.

Surfaces (Technology)- Analysis.

Spectroscopy and Microscopy.

Atomic force microscopy.

Electric insulators and insulation- Testing.

Scanning tunneling microscopy.

Physics.

Optical and Electronic Materials.

Characterization and Evaluation of Materials.

Semiconductors- Testing.