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主題
Semiconductors - Testing.
概要
作品:
5 作品在 1 項出版品 1 種語言
書目資訊
Semiconductor material and device characterization /
by:
(書目-語言資料,印刷品)
Surface analysis with STM and AFM : = experimental and theoretical aspects of image analysis /
by:
(書目-語言資料,印刷品)
Semiconductor material and device characterization /
by:
(書目-語言資料,印刷品)
X-ray absorption spectroscopy of semiconductors
by:
(書目-電子資源)
Semiconductor material and device characterization /
by:
(書目-語言資料,印刷品)
主題
Semiconductors.
X-ray spectroscopy.
Metals- Surfaces
X-rays- Industrial applications.
Optics and Electrodynamics.
Applied and Technical Physics.
Surfaces (Technology)- Analysis.
Spectroscopy and Microscopy.
Atomic force microscopy.
Electric insulators and insulation- Testing.
Scanning tunneling microscopy.
Physics.
Optical and Electronic Materials.
Characterization and Evaluation of Materials.
Semiconductors- Testing.
處理中
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