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主題
Semiconductors - Failures.
概要
作品:
5 作品在 1 項出版品 1 種語言
書目資訊
Electromigration and electronic device degradation /
by:
(書目-語言資料,印刷品)
Data Mining and Diagnosing IC Fails
by:
(書目-語言資料,印刷品)
Electrical overstress (EOS) = devices, circuits, and systems /
by:
(書目-電子資源)
Systematische Beurteilung technischer Schadensfälle
by:
(書目-電子資源)
Wire bonding in microelectronics
by:
(書目-電子資源)
主題
Semiconductors- Failures.
Semiconductors- Protection.
Data mining.
Electronics and Microelectronics, Instrumentation.
Transients (Electricity)
Overvoltage.
Electrodiffusion.
Circuits and Systems.
Wire bonding (Electronic packaging)- Production control.
Electronic packaging- Reliability.
Integrated circuits- Testing
Integrated circuits- Deterioration.
Engineering.
Electronic packaging- Defects.
處理中
...
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