Semiconductors - Failures.

Electromigration and electronic device degradation / by: (Language materials, printed)

Data Mining and Diagnosing IC Fails by: (Language materials, printed)

Electrical overstress (EOS) = devices, circuits, and systems / by: (Electronic resources)

Systematische Beurteilung technischer Schadensfälle by: (Electronic resources)

Wire bonding in microelectronics by: (Electronic resources)

Semiconductors- Failures.

Semiconductors- Protection.

Data mining.

Electronics and Microelectronics, Instrumentation.

Transients (Electricity)

Overvoltage.

Electrodiffusion.

Circuits and Systems.

Wire bonding (Electronic packaging)- Production control.

Electronic packaging- Reliability.

Integrated circuits- Testing

Integrated circuits- Deterioration.

Engineering.

Electronic packaging- Defects.