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Integrated circuits - Very large scale integration - Testing.

概要

作品:	13 作品在 4 項出版品 4 種語言

書目資訊

System-on-chip test architectures : = nanometer design for testability / by: (書目-語言資料,印刷品)

IDDQ testing of VLSI circuits / by: (書目-語言資料,印刷品)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / by: (書目-語言資料,印刷品)

Power-constrained testing of VLSI circuits by: (書目-電子資源)

VLSI test principles and architectures : = design for testability / by: (書目-語言資料,印刷品)

System-on-chip test architectures = nanometer design for testability / by: (書目-語言資料,印刷品)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by: (書目-語言資料,印刷品)

VLSI test principles and architectures = design for testability / by: (書目-電子資源)

Debug automation from pre-silicon to post-silicon by: (書目-電子資源)

VLSI design and test for systems dependability by: (書目-電子資源)

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主題

Integrated circuits- Very large scale integration

Mixed signal circuits- Testing.

Integrated circuits / Very large scale integration / Testing.

VLSI.

Genetic algorithms.

Semiconductors- Thermal properties.

Circuits int�egr�es �a tr�es grande �echelle- Conception et construction.

Engineering Design.

Metal oxide semiconductors, Complementary- Testing.

Circuits int�egr�es �a tr�es grande �echelle- Essais.

Integrated circuits / Very large scale integration / Design.

Control Structures and Microprogramming.

TECHNOLOGY & ENGINEERING- Electronics

Processor Architectures.

COMPUTERS- Logic Design.

Circuits and Systems.

Semiconductor storage devices- Testing.

Crosstalk.

Performance and Reliability.

Digital integrated circuits- Testing.

Circuitos integrados vlsi.

Testen.

Systems and Data Security.

Integrated circuit layout.

Systems on a chip- Testing.

Electronic Circuits and Devices.

Quality Control, Reliability, Safety and Risk.

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