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Search result for
[ subject:"Integrated circuits- Testing"]
8 records (0.153s)
·
Page 1 of 1
•
1
1
.
Integration of test with design and ...
~
IEEE Computer Society., Test Technology Technical Committee.
Linked to FindBook
Google Book
Amazon
博客來
Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
by:
IEEE Computer Society., Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers., Philadelphia Section.; International Test Conference (1987 :)
Language materials, printed
: Monograph/item
Publisher:
Order from Computer Society of the IEEE,; Computer Society Press of the IEEE ;
Place of Publication:
Washington, D.C. :
Year of Publication:
1987
ISBN:
081860798X; 0818647981; 0818687983
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
2
.
Proceedings : = International Test C...
~
IEEE Computer Society., Test Technology Technical Committee.
Linked to FindBook
Google Book
Amazon
博客來
Proceedings : = International Test Conference 1992 /
by:
IEEE Computer Society., Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers., Philadelphia Section.; International Test Conference (1992 :)
Language materials, printed
: Monograph/item
Publisher:
Can be ordered from IEEE Service Center,; The Conference ;
Place of Publication:
Piscataway, NJ :
Year of Publication:
1992
ISBN:
0780307607; 081863166X; 0818631678
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
3
.
Proceedings : = International Test C...
~
IEEE Computer Society., Test Technology Technical Committee.
Linked to FindBook
Google Book
Amazon
博客來
Proceedings : = International Test Conference 1993 /
by:
IEEE Computer Society., Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.; International Test Conference (1993 :)
Language materials, printed
: Monograph/item
Publisher:
International Test Conference ;; [Distributor] IEEE Service Center,
Place of Publication:
Piscataway, NJ :
Year of Publication:
1993
ISBN:
0780314298; 0780314301; 078031431X
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
4
.
Proceedings : = the European Design ...
~
IEEE Computer Society.
Linked to FindBook
Google Book
Amazon
博客來
Proceedings : = the European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995 /
by:
IEEE Computer Society.; European Design and Test Conference ((1995 :)
Language materials, printed
: Monograph/item
Publisher:
IEEE Computer Society Press,
Place of Publication:
Los Alamitos, California :
Year of Publication:
1995
ISBN:
0780325397; 0818670398
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
5
.
Proceedings, the European Design and...
~
European Design Automation Association.
Linked to FindBook
Google Book
Amazon
博客來
Proceedings, the European Design and Test Conference : = EDAC, the European Conference on Design Automation : ETC, European Test Conference : EUROASIC, the European event in ASIC design : February 29-March 3, 1994, Paris, France /
by:
European Design Automation Association.; European Design and Test Conference ((1994 :)
Language materials, printed
: Monograph/item
Publisher:
IEEE Computer Society Press,
Place of Publication:
Los Alamitos, Calif. :
Year of Publication:
1994
ISBN:
0818654104; 0818654112
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
6
.
Proceedings : = International Test C...
~
IEEE Computer Society., Test Technology Technical Committee.
Linked to FindBook
Google Book
Amazon
博客來
Proceedings : = International Test Conference 1994 /
by:
IEEE Computer Society., Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.; International Test Conference (1994 :)
Language materials, printed
: Monograph/item
Publisher:
The Conference ;; additional copies can be ordered from IEEE Service Center,
Place of Publication:
Piscataway, N.J. :
Year of Publication:
1994
ISBN:
0780321022; 0780321030; 0780321049
Availability
:
1 Copie(s) available
|
1 Copie(s) available for loan
based on 0 review(s)
7
.
Data Mining and Diagnosing IC Fails
~
SpringerLink (Online service)
Linked to FindBook
Google Book
Amazon
博客來
Data Mining and Diagnosing IC Fails
by:
SpringerLink (Online service); Huisman, Leendert M.
Language materials, printed
: Monograph/item
Publisher:
Springer Science+Business Media, Inc.,
Place of Publication:
Boston, MA :
Year of Publication:
2005
ISBN:
9780387249933; 9780387263519
Availability
:
1 Copie(s) available
|
0 Copie(s) available for loan
based on 0 review(s)
8
.
Hardware and software: verification ...
~
Namjoshi, Kedar.
Linked to FindBook
Google Book
Amazon
博客來
Hardware and software: verification and testing = 5th International Haifa Verification Conference, HCV 2009, Haifa, Israel, October 19-22, 2009 : revised selected papers /
by:
Namjoshi, Kedar.; Zeller, Andreas.; Ziv, Avi.; SpringerLink (Online service)
Electronic resources
: Monograph/item
Publisher:
Springer Berlin Heidelberg,
Place of Publication:
Berlin, Heidelberg :
Year of Publication:
2011
ISBN:
9783642192364; 9783642192371
Availability
:
1 Copie(s) available
|
0 Copie(s) available for loan
based on 0 review(s)
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