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X-ray scattering from semiconductors...

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Fewster, Paul F.

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X-ray scattering from semiconductors and other materials

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	X-ray scattering from semiconductors and other materials/ Paul F. Fewster.
作者:	Fewster, Paul F.
出版者:	New Jersey :World Scientific, : 2015.,
面頁冊數:	1 online resource (xvi, 493 p.) :ill.
內容註:	An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
標題:	X-rays - Scattering. -
電子資源:	http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc
ISBN:	9789814436939 (electronic bk.)

X-ray scattering from semiconductors and other materials
Fewster, Paul F.

X-ray scattering from semiconductors and other materials[electronic resource] /Paul F. Fewster. - 3rd ed. - New Jersey :World Scientific,2015. - 1 online resource (xvi, 493 p.) :ill.

Includes bibliographical references (p. 475-476) and index.

An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.

ISBN: 9789814436939 (electronic bk.)

LCCN: 2014031060Subjects--Topical Terms:

820025
X-rays
--Scattering.

/ F49 2015

Dewey Class. No.: 537.5/35

X-ray scattering from semiconductors and other materials
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300 $a 1 online resource (xvi, 493 p.) : $b ill.
504 $a Includes bibliographical references (p. 475-476) and index.
505 0 $a An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
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