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Optical characterization of thin sol...

Stenzel, Olaf.

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Optical characterization of thin solid films

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Optical characterization of thin solid films/ edited by Olaf Stenzel, Miloslav Ohlidal.
其他作者:	Stenzel, Olaf.
出版者:	Cham :Springer International Publishing : : 2018.,
面頁冊數:	xxiv, 462 p. :ill., digital ;24 cm.
內容註:	Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
Contained By:	Springer eBooks
標題:	Thin films - Optical properties. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-75325-6
ISBN:	9783319753256

Optical characterization of thin solid films
Optical characterization of thin solid films[electronic resource] /edited by Olaf Stenzel, Miloslav Ohlidal. - Cham :Springer International Publishing :2018. - xxiv, 462 p. :ill., digital ;24 cm. - Springer series in surface sciences,v.640931-5195 ;. - Springer series in surface sciences ;v.64..

Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

ISBN: 9783319753256

Standard No.: 10.1007/978-3-319-75325-6doiSubjects--Topical Terms:

718346
Thin films
--Optical properties.

LC Class. No.: QC176.84.O7 / O685 2018

Dewey Class. No.: 621.38152

Optical characterization of thin solid films
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505 0 $a Introduction and modelling activities -- Optical film characterization topics: An overview -- Universal dispersion model for characterization of optical thin films over wide spectral range -- Predicting optical properties of oxides from ab initio calculations -- Spectrophotometry and spectral ellipsometry -- Optical characterization of thin films by means of spectroscopic imaging spectrophotometry -- Data processing methods for imaging spectrophotometry -- In-situ and ex-situ spectrophotometry in thin film characterization -- Ellipsometric characterization of thin solid films -- Characterization of defective and corrugated coatings -- Optical characterization of thin films exhibiting defects -- Scanning probe microscopy characterization of optical thin films -- Resonant grating waveguide structures -- Absorption and scatter -- Roughness and scatter in optical coatings -- Absorption and fluorescence measurements in optical coatings -- Cavity ring-down technique for optical coating characterization.
520 $a This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
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