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Speckle metrology /

~

Sirohi, R. S.

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Speckle metrology /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Speckle metrology // edited by Rajpal S. Sirohi.
其他作者:	Sirohi, R. S.
出版者:	New York :Marcel Dekker, : c1993.,
面頁冊數:	xiii, 551 p. :ill. ;24 cm.
標題:	Non-destructive testing. -
ISBN:	0824789326 (acid-free paper)

Speckle metrology /
Speckle metrology /edited by Rajpal S. Sirohi. - New York :Marcel Dekker,c1993. - xiii, 551 p. :ill. ;24 cm. - Optical engineering ;38. - Optical engineering (Marcel Dekker, Inc.) ;v. 38..

Includes bibliographical references and index.

ISBN: 0824789326 (acid-free paper)

LCCN: 93000734Subjects--Topical Terms:

649428
Non-destructive testing.

LC Class. No.: TA417.2 / .S66 1993

Dewey Class. No.: 620.1/127

Speckle metrology /
LDR:00573nam a2200193 a 45 001 654593
003 DLC
005 19930819170006.6
008 930225s1993 nyua b 001 0 eng
010 $a 93000734
020 $a 0824789326 (acid-free paper)
035 $a jg 00000416
040 $a DLC $c DLC $d DLC
050 0 0 $a TA417.2 $b .S66 1993
082 0 0 $a 620.1/127 $2 20
245 0 0 $a Speckle metrology / $c edited by Rajpal S. Sirohi.
260 $a New York : $c c1993. $b Marcel Dekker,
300 $a xiii, 551 p. : $b ill. ; $c 24 cm.
490 1 $a Optical engineering ; $v 38
504 $a Includes bibliographical references and index.
650 $a Non-destructive testing. $3 649428
650 $a Speckle metrology. $3 674171
700 $a Sirohi, R. S. $3 674170
830 $a Optical engineering (Marcel Dekker, Inc.) ; $v v. 38. $3 674172

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