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Shallow impurities in semiconductors...

Taguchi, Tsunemasa.

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Shallow impurities in semiconductors : = proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Shallow impurities in semiconductors :/ editor, Tsunemasa Taguchi.
其他題名:	proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 /
其他作者:	Taguchi, Tsunemasa.
出版者:	Aedemannsdorf, Switzerland ;Trans Tech Publications, : c1993.,
面頁冊數:	528 p. :ill. ;25 cm.
叢書名:	Materials science forum ;
標題:	Semiconductors - Defects -
ISBN:	0878496548 (pbk.)

Shallow impurities in semiconductors : = proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 /
Shallow impurities in semiconductors :proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 /editor, Tsunemasa Taguchi. - Aedemannsdorf, Switzerland ;Trans Tech Publications,c1993. - 528 p. :ill. ;25 cm. - Materials science forum ;v. 117-118.

Includes bibliographical references and indexes.

ISBN: 0878496548 (pbk.)Subjects--Topical Terms:

649599
Semiconductors
--Defects

LC Class. No.: QC611.6.D4 / S53 1991

Shallow impurities in semiconductors : = proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 /
LDR:00793nam a2200169 a 45 001 653811
005 19980223133548.1
008 950818s1993 sz a b 10100 eng d
020 $a 0878496548 (pbk.)
035 $a dt 00011793
040 $a NDHU $c NDHU $d NDHU
050 $a QC611.6.D4 $b S53 1991
050 $a TA401 $b .M365 v.65-66, 1990
245 0 0 $a Shallow impurities in semiconductors : $b proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors, "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August 1992 / $c editor, Tsunemasa Taguchi.
260 $a Aedemannsdorf, Switzerland ; $a Brookfield, VT : $c c1993. $b Trans Tech Publications,
300 $a 528 p. : $b ill. ; $c 25 cm.
440 0 $a Materials science forum ; $v v. 117-118
504 $a Includes bibliographical references and indexes.
650 $a Semiconductors $x Defects $x Congresses. $3 649599
650 $a Semiconductors $x Impurity distribution $x Congresses. $3 672499
700 $a Taguchi, Tsunemasa. $3 672498
711 $a International Conference on Shallow Impurities in Semiconductors $n (5th : $d 1992 : $c Japan) $3 672500