語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
到查詢結果
[ subject:"Nanostructured materials- Analysis." ]
切換:
標籤
|
MARC模式
|
ISBD
Analytical methods and instruments f...
~
Radamson, Henry H.
FindBook
Google Book
Amazon
博客來
Analytical methods and instruments for micro- and nanomaterials
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
Analytical methods and instruments for micro- and nanomaterials/ by Henry H. Radamson ... [et al.].
其他作者:
Radamson, Henry H.
出版者:
Cham :Springer International Publishing : : 2023.,
面頁冊數:
xvi, 282 p. :ill., digital ;24 cm.
內容註:
Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)
Contained By:
Springer Nature eBook
標題:
Nanostructured materials - Analysis. -
電子資源:
https://doi.org/10.1007/978-3-031-26434-4
ISBN:
9783031264344
Analytical methods and instruments for micro- and nanomaterials
Analytical methods and instruments for micro- and nanomaterials
[electronic resource] /by Henry H. Radamson ... [et al.]. - Cham :Springer International Publishing :2023. - xvi, 282 p. :ill., digital ;24 cm. - Lecture notes in nanoscale science and technology,v. 232195-2167 ;. - Lecture notes in nanoscale science and technology ;v. 23..
Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
ISBN: 9783031264344
Standard No.: 10.1007/978-3-031-26434-4doiSubjects--Topical Terms:
1532094
Nanostructured materials
--Analysis.
LC Class. No.: TA418.9.N35
Dewey Class. No.: 620.115
Analytical methods and instruments for micro- and nanomaterials
LDR
:02572nmm a2200337 a 4500
001
2333601
003
DE-He213
005
20230810132227.0
006
m d
007
cr nn 008maaau
008
240402s2023 sz s 0 eng d
020
$a
9783031264344
$q
(electronic bk.)
020
$a
9783031264337
$q
(paper)
024
7
$a
10.1007/978-3-031-26434-4
$2
doi
035
$a
978-3-031-26434-4
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TA418.9.N35
072
7
$a
TGMT
$2
bicssc
072
7
$a
TEC021000
$2
bisacsh
072
7
$a
TGMT
$2
thema
082
0 4
$a
620.115
$2
23
090
$a
TA418.9.N35
$b
A532 2023
245
0 0
$a
Analytical methods and instruments for micro- and nanomaterials
$h
[electronic resource] /
$c
by Henry H. Radamson ... [et al.].
260
$a
Cham :
$b
Springer International Publishing :
$b
Imprint: Springer,
$c
2023.
300
$a
xvi, 282 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Lecture notes in nanoscale science and technology,
$x
2195-2167 ;
$v
v. 23
505
0
$a
Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs)
520
$a
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials.
650
0
$a
Nanostructured materials
$x
Analysis.
$3
1532094
650
1 4
$a
Characterization and Analytical Technique.
$3
3538501
650
2 4
$a
Nanophysics.
$3
3538500
650
2 4
$a
Spectroscopy.
$3
699574
650
2 4
$a
Optical Materials.
$3
3538499
650
2 4
$a
Nanotechnology.
$3
526235
700
1
$a
Radamson, Henry H.
$3
3664488
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer Nature eBook
830
0
$a
Lecture notes in nanoscale science and technology ;
$v
v. 23.
$3
3664489
856
4 0
$u
https://doi.org/10.1007/978-3-031-26434-4
950
$a
Chemistry and Materials Science (SpringerNature-11644)
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9459806
電子資源
11.線上閱覽_V
電子書
EB TA418.9.N35
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入