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[ subject:"Integrated circuits- Testing." ]
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Nanometer technology designs = high-...
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Ahmed, Nisar.
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Nanometer technology designs = high-quality delay tests /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Nanometer technology designs/ by Mohammad Tehranipoor, Nisar Ahmed.
其他題名:
high-quality delay tests /
作者:
Tehranipoor, Mohammad.
其他作者:
Ahmed, Nisar.
出版者:
Boston, MA :Springer US, : 2008.,
面頁冊數:
xvii, 281 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
標題:
Integrated circuits - Testing. -
電子資源:
http://dx.doi.org/10.1007/978-0-387-75728-5
ISBN:
9780387757285 (electronic bk.)
Nanometer technology designs = high-quality delay tests /
Tehranipoor, Mohammad.
Nanometer technology designs
high-quality delay tests /[electronic resource] :by Mohammad Tehranipoor, Nisar Ahmed. - Boston, MA :Springer US,2008. - xvii, 281 p. :ill., digital ;24 cm.
ISBN: 9780387757285 (electronic bk.)Subjects--Topical Terms:
658491
Integrated circuits
--Testing.
Dewey Class. No.: 621.381548
Nanometer technology designs = high-quality delay tests /
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