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Integration of test with design and ...

IEEE Computer Society., Test Technology Technical Committee.

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Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Integration of test with design and manufacturing :/ sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
其他題名:	September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
團體作者:	International Test Conference
出版者:	Washington, D.C. :Computer Society Press of the IEEE ; : c1987.,
面頁冊數:	xxxi, 1151 p. :ill. ;28 cm.
附註:	"Computer Society order no. 789."
標題:	Electronic digital computers -
ISBN:	081860798X (pbk.) :

Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
Integration of test with design and manufacturing :September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /sponsored by the IEEE Computer Society, IEEE Philadelphia Section. - Washington, D.C. :Computer Society Press of the IEEE ;c1987. - xxxi, 1151 p. :ill. ;28 cm.

"Computer Society order no. 789."

Includes bibliographies and index.

ISBN: 081860798X (pbk.) :US180.00

LCCN: 87080439Subjects--Topical Terms:

659600
Electronic digital computers

LC Class. No.: TK7874 / .I593 1987

Dewey Class. No.: 621.381/73

Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
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245 1 0 $a Integration of test with design and manufacturing : $b September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. / $c sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
260 0 $a Washington, D.C. : $a Los Angeles, CA : $c c1987. $b Computer Society Press of the IEEE ; $b Order from Computer Society of the IEEE,
300 $a xxxi, 1151 p. : $b ill. ; $c 28 cm.
500 $a "Computer Society order no. 789."
500 $a "IEEE catalog no. 87CH2347-2."
500 $a Spine title: International Test Conference 1987 : proceedings.
504 $a Includes bibliographies and index.
650 $a Electronic digital computers $3 659600
650 $a Integrated circuits $x Testing $x Congresses. $3 659601
710 $a IEEE Computer Society. $b Test Technology Technical Committee. $3 659597
710 $a Institute of Electrical and Electronics Engineers. $b Philadelphia Section. $3 659598
740 0 1 $a International Test Conference 1987 : proceedings.