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ESD protection methodologies = from ...

Bafleur, Marise,

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ESD protection methodologies = from component to system /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	ESD protection methodologies/ Marise Bafleur, Fabrice Caignet and Nicolas Nolhier.
其他題名:	from component to system /
作者:	Bafleur, Marise,
其他作者:	Caignet, Fabrice,
出版者:	London :ISTE Press ; : 2017.,
面頁冊數:	1 online resource :ill.
內容註:	Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methods.
內容註:	2.3. Injection methods2.4. Failure analysis techniques; 2.5. Conclusion; 3. Protection Strategies Against ESD; 3.1. ESD design window; 3.2. Elementary protective components; 3.3. Discrete protections; 3.4. Challenges of the protection strategy at the system level; 3.5. Conclusion; 4. Modeling and Simulation Methods; 4.1. Physical simulation: TCAD approach to the optimization of elementary protections; 4.2. Electrical simulation: Compact modeling; 4.3. Behavioral simulation for prediction at the system level; 4.4. Conclusion; 5. Case Studies.
內容註:	5.1. Case 1: Interaction between two types of protection5.2. Case 2: Detection of latent defaults caused by CDM stress; 5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit; 5.4. Case 4: Functional failure linked to a decoupling capacitor; 5.5. Case 5: Fatal failure in an LIN circuit; 5.6. Case 6: Functional failure in a 16-bit microcontroller; 5.7. Conclusion; Conclusion; General rules for a global ESD protection strategy; Conclusion; Bibliography; Index; Back Cover.
標題:	Electric discharges. -
電子資源:	https://www.sciencedirect.com/science/book/9781785481222
ISBN:	9780081011607 (electronic bk.)

ESD protection methodologies = from component to system /
Bafleur, Marise,

ESD protection methodologiesfrom component to system /[electronic resource] :Marise Bafleur, Fabrice Caignet and Nicolas Nolhier. - London :ISTE Press ;2017. - 1 online resource :ill. - Energy management in embedded systems set.. - Energy management in embedded systems set..

Includes bibliographical references and index.

Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methods.

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, itis important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties relatedto the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

ISBN: 9780081011607 (electronic bk.)

LCCN: 2017300207Subjects--Topical Terms:

687894
Electric discharges.
Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: QC585.7.E43

Dewey Class. No.: 621.3815

ESD protection methodologies = from component to system /
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260 $a London : $b ISTE Press ; $a Oxford : $b Elsevier Ltd., $c 2017.
300 $a 1 online resource : $b ill.
490 1 $a Energy management in embedded systems set.
504 $a Includes bibliographical references and index.
505 0 $a Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methods.
505 8 $a 2.3. Injection methods2.4. Failure analysis techniques; 2.5. Conclusion; 3. Protection Strategies Against ESD; 3.1. ESD design window; 3.2. Elementary protective components; 3.3. Discrete protections; 3.4. Challenges of the protection strategy at the system level; 3.5. Conclusion; 4. Modeling and Simulation Methods; 4.1. Physical simulation: TCAD approach to the optimization of elementary protections; 4.2. Electrical simulation: Compact modeling; 4.3. Behavioral simulation for prediction at the system level; 4.4. Conclusion; 5. Case Studies.
505 8 $a 5.1. Case 1: Interaction between two types of protection5.2. Case 2: Detection of latent defaults caused by CDM stress; 5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit; 5.4. Case 4: Functional failure linked to a decoupling capacitor; 5.5. Case 5: Fatal failure in an LIN circuit; 5.6. Case 6: Functional failure in a 16-bit microcontroller; 5.7. Conclusion; Conclusion; General rules for a global ESD protection strategy; Conclusion; Bibliography; Index; Back Cover.
520 $a Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, itis important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties relatedto the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.
650 0 $a Electric discharges. $3 687894
650 0 $a Electrostatics. $3 542300
650 0 $a Electronic apparatus and appliances $x Protection. $3 687895
650 7 $a TECHNOLOGY & ENGINEERING $x Mechanical. $2 bisacsh $3 3508527
655 0 $a Electronic books. $2 lcsh $3 542853
700 1 $a Caignet, Fabrice, $e author. $3 3509125
700 1 $a Nolhier, Nicolas, $e author. $3 3509126
830 0 $a Energy management in embedded systems set. $3 3462979
856 4 0 $u https://www.sciencedirect.com/science/book/9781785481222