語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
到查詢結果
[ author_sort:"sibilia, john p." ]
切換:
標籤
|
MARC模式
|
ISBD
A guide to materials characterizatio...
~
Sibilia, John P.
FindBook
Google Book
Amazon
博客來
A guide to materials characterization and chemical analysis /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
A guide to materials characterization and chemical analysis // edited by John P. Sibilia.
其他作者:
Sibilia, John P.
出版者:
New York :VCH, : c1996.,
面頁冊數:
xii, 388 p. :ill. ;24 cm.
內容註:
An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
標題:
Chemistry, Analytic. -
ISBN:
0471186333 :
A guide to materials characterization and chemical analysis /
A guide to materials characterization and chemical analysis /
edited by John P. Sibilia. - 2nd ed. - New York :VCH,c1996. - xii, 388 p. :ill. ;24 cm.
Includes bibliographical references and index.
An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
ISBN: 0471186333 :US104.95
LCCN: 96001306 //r98Subjects--Topical Terms:
517805
Chemistry, Analytic.
Subjects--Index Terms:
Chemical analysis.
LC Class. No.: QD75.2 / .G83 1996
Dewey Class. No.: 543
A guide to materials characterization and chemical analysis /
LDR
:01658pam a2200217 a 45
001
690063
003
aOCoLC
005
20031001
008
031001s1996 nyua b 001 0 eng
010
$a
96001306 //r98
020
$a
0471186333 :
$c
US104.95
035
$a
CS92T0057
040
$a
DLC
$c
DLC
$d
PMC
$d
UKM
$d
DH
050
4
$a
QD75.2
$b
.G83 1996
082
0 0
$a
543
$2
20
245
0 2
$a
A guide to materials characterization and chemical analysis /
$c
edited by John P. Sibilia.
250
$a
2nd ed.
260
$a
New York :
$c
c1996.
$b
VCH,
300
$a
xii, 388 p. :
$b
ill. ;
$c
24 cm.
504
$a
Includes bibliographical references and index.
505
0
$a
An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
650
$a
Chemistry, Analytic.
$3
517805
650
$a
Materials
$x
Testing.
$3
601009
653
0
$a
Chemical analysis.
700
$a
Sibilia, John P.
$3
685989
筆 0 讀者評論
館藏地:
全部
六樓西文書區HC-Z(6F Western Language Books)
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W0048817
六樓西文書區HC-Z(6F Western Language Books)
01.外借(書)_YB
一般圖書
QD75.2 G83 1996
一般使用(Normal)
在架
0
預約
1 筆 • 頁數 1 •
1
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入