Advanced test methods for SRAMs = ef...
Bosio, Alberto.

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  • Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Advanced test methods for SRAMs/ by Alberto Bosio ... [et al.].
    Reminder of title: effective solutions for dynamic fault detection in nanoscaled technologies /
    other author: Bosio, Alberto.
    Published: Boston, MA :Springer-Verlag US, : 2010.,
    Description: xv, 171 p. :ill., digital ;24 cm.
    Contained By: Springer eBooks
    Subject: Random access memory - Testing. -
    Online resource: http://dx.doi.org/10.1007/978-1-4419-0938-1
    ISBN: 9781441909374 (paper)
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