Nanometer technology designs = high-...
Ahmed, Nisar.

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  • Nanometer technology designs = high-quality delay tests /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Nanometer technology designs/ by Mohammad Tehranipoor, Nisar Ahmed.
    Reminder of title: high-quality delay tests /
    Author: Tehranipoor, Mohammad.
    other author: Ahmed, Nisar.
    Published: Boston, MA :Springer US, : 2008.,
    Description: xvii, 281 p. :ill., digital ;24 cm.
    Contained By: Springer eBooks
    Subject: Integrated circuits - Testing. -
    Online resource: http://dx.doi.org/10.1007/978-0-387-75728-5
    ISBN: 9780387757285 (electronic bk.)
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