CTL for test information of digital ICs
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  • CTL for test information of digital ICs
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: CTL for test information of digital ICs/ by Rohit Kapur.
    Author: Kapur, Rohit.
    Published: Boston :Kluwer Academic Publishers, : c2002.,
    Description: ix, 173 p. :ill., digital ;24 cm.
    Contained By: Springer e-books
    Subject: Computer hardware description languages. -
    Online resource: http://dx.doi.org/10.1007/b101870
    ISBN: 9780306478260 (electronic bk.)
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