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Anomalous X-ray scattering for materials characterization = atomic-scale structure determination /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Anomalous X-ray scattering for materials characterization/ Yoshio Waseda.
Reminder of title:	atomic-scale structure determination /
Author:	Waseda, Yoshio.
Published:	Berlin ;Springer, : c2002.,
Description:	xiii, 214 p. :ill., digital ;24 cm.
Series:	Springer tracts in modern physics,
Contained By:	Springer eBooks
Subject:	X-ray crystallography. -
Online resource:	http://dx.doi.org/10.1007/3-540-46008-X
ISBN:	9783540434436 (paper)

Anomalous X-ray scattering for materials characterization = atomic-scale structure determination /
Waseda, Yoshio.

Anomalous X-ray scattering for materials characterizationatomic-scale structure determination /[electronic resource] :Yoshio Waseda. - Berlin ;Springer,c2002. - xiii, 214 p. :ill., digital ;24 cm. - Springer tracts in modern physics,v. 1790081-3869 ;.

ISBN: 9783540434436 (paper)Subjects--Topical Terms:

544433
X-ray crystallography.

LC Class. No.: QC482.S3 / .S797 2002

Dewey Class. No.: 548.83

Anomalous X-ray scattering for materials characterization = atomic-scale structure determination /
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100 1 $a Waseda, Yoshio. $3 1001683
245 1 0 $a Anomalous X-ray scattering for materials characterization $h [electronic resource] : $b atomic-scale structure determination / $c Yoshio Waseda.
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300 $a xiii, 214 p. : $b ill., digital ; $c 24 cm.
440 0 $a Springer tracts in modern physics, $x 0081-3869 ; $v v. 179
650 0 $a X-ray crystallography. $3 544433
650 0 $a X-rays $x Scattering. $3 820025
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