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Atomic force microscopy in process engineering = introduction to AFM for improved processes and products /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Atomic force microscopy in process engineering/ [edited by] W. Richard Bowen and Nidal Hilal.
Reminder of title:	introduction to AFM for improved processes and products /
other author:	Bowen, W. Richard.
Published:	Oxford ;Elsevier/Butterworth-Heinemann, : 2009.,
Description:	1 online resource (xvi, 283 p.) :ill.
Notes:	Description based on print version record.
[NT 15003449]:	BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES/ W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS/ Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING/ Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY/ Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
Subject:	Atomic force microscopy. -
Online resource:	http://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=249345
Online resource:	http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9781856175173An electronic book accessible through the World Wide Web; click for information
Online resource:	http://www.sciencedirect.com/science/book/9781856175173
ISBN:	0080949576 (electronic bk.)

Atomic force microscopy in process engineering = introduction to AFM for improved processes and products /
Atomic force microscopy in process engineeringintroduction to AFM for improved processes and products /[electronic resource] :[edited by] W. Richard Bowen and Nidal Hilal. - 1st ed. - Oxford ;Elsevier/Butterworth-Heinemann,2009. - 1 online resource (xvi, 283 p.) :ill.

Description based on print version record.

Includes bibliographical references and index.

BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES/ W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS/ Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING/ Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY/ Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.

ISBN: 0080949576 (electronic bk.)Subjects--Topical Terms:

587940
Atomic force microscopy.
Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: QH212.A78 / B69 2009eb

Dewey Class. No.: 620/.5

Atomic force microscopy in process engineering = introduction to AFM for improved processes and products /
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020 $a 0080949576 (electronic bk.)
020 $a 9780080949574 (electronic bk.)
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050 4 $a QH212.A78 $b B69 2009eb
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245 0 0 $a Atomic force microscopy in process engineering $h [electronic resource] : $b introduction to AFM for improved processes and products / $c [edited by] W. Richard Bowen and Nidal Hilal.
250 $a 1st ed.
260 $a Oxford ; $a Burlington, MA : $c 2009. $b Elsevier/Butterworth-Heinemann,
300 $a 1 online resource (xvi, 283 p.) : $b ill.
500 $a Description based on print version record.
504 $a Includes bibliographical references and index.
505 0 $a BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson -- CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva -- AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES/ W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib -- APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson -- QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS/ Nidal Hilal and Daniel Johnson -- NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts -- THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING/ Chris J Wright -- THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright -- ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos -- AFM-BASED MICRO/NANO-RHEOMETRY/ Matthew S Barrow and P Rhodri Williams -- CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.
520 $a Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM. The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.
650 0 $a Atomic force microscopy. $3 587940
650 0 $a Production engineering. $3 654420
655 7 $a Electronic books. $2 lcsh $3 542853
700 1 $a Bowen, W. Richard. $3 1001848
700 1 $a Hilal, Nidal. $3 1068030
856 4 0 $3 NetLibrary $u http://www.netlibrary.com/urlapi.asp?action=summary&v=1&bookid=249345
856 4 0 $3 Referex $u http://www.engineeringvillage.com/controller/servlet/OpenURL?genre=book&isbn=9781856175173 $z An electronic book accessible through the World Wide Web; click for information
856 4 0 $u http://www.sciencedirect.com/science/book/9781856175173
994 $a C0 $b TEF