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Semiconductor material and device characterization /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Semiconductor material and device characterization // Dieter K. Schroder.
作者:
Schroder, Dieter K.
出版者:
New York :Wiley, : c1998.,
面頁冊數:
xxiv, 760 p. :ill. ;25 cm.
附註:
"A Wiley-Interscience publication."
標題:
Semiconductors - Testing. -
電子資源:
http://www.loc.gov/catdir/toc/onix02/97052094.htmlhttp://www.loc.gov/catdir/toc/onix02/97052094.html
電子資源:
http://www.loc.gov/catdir/bios/wiley047/97052094.htmlhttp://www.loc.gov/catdir/bios/wiley047/97052094.html
電子資源:
http://www.loc.gov/catdir/description/wiley032/97052094.htmlhttp://www.loc.gov/catdir/description/wiley032/97052094.html
ISBN:
0471241393 (cloth : alk. paper)
Semiconductor material and device characterization /
Schroder, Dieter K.
Semiconductor material and device characterization /
Dieter K. Schroder. - 2nd ed. - New York :Wiley,c1998. - xxiv, 760 p. :ill. ;25 cm.
"A Wiley-Interscience publication."
Includes bibliographical references and index.
ISBN: 0471241393 (cloth : alk. paper)
LCCN: 97052094Subjects--Topical Terms:
699774
Semiconductors
--Testing.
LC Class. No.: QC611 / .S335 1998
Dewey Class. No.: 621.3815/2
Semiconductor material and device characterization /
LDR
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GW0010422
六樓西文書區HC-Z(6F Western Language Books)
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