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Transmission Electron Microscopy and...
~
Howe, James M.
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Transmission Electron Microscopy and Diffractometry of Materials
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Transmission Electron Microscopy and Diffractometry of Materials/ by Brent Fultz, James M. Howe.
Author:
Fultz, Brent.
other author:
Howe, James M.
Published:
Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2008.,
Description:
xix, 758 p. :ill., digital ;24 cm.
Contained By:
Springer e-books
Subject:
Materials - Microscopy. -
Online resource:
http://dx.doi.org/10.1007/978-3-540-73886-2http://dx.doi.org/10.1007/978-3-540-73886-2
ISBN:
9783540738855 (paper)
Transmission Electron Microscopy and Diffractometry of Materials
Fultz, Brent.
Transmission Electron Microscopy and Diffractometry of Materials
[electronic resource] /by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2008. - xix, 758 p. :ill., digital ;24 cm.
ISBN: 9783540738855 (paper)Subjects--Topical Terms:
559323
Materials
--Microscopy.
LC Class. No.: TA417.23 / .F85 2008
Dewey Class. No.: 620.11299
Transmission Electron Microscopy and Diffractometry of Materials
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by Brent Fultz, James M. Howe.
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2008.
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xix, 758 p. :
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ill., digital ;
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24 cm.
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Materials
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Transmission electron microscopy.
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Chemistry.
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Characterization and Evaluation of Materials.
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Crystallography.
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Physics and Applied Physics in Engineering.
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Solid State Physics and Spectroscopy.
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Surfaces and Interfaces, Thin Films.
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Howe, James M.
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Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)
based on 0 review(s)
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Items
1 records • Pages 1 •
1
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W9046815
電子資源
11.線上閱覽_V
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1 records • Pages 1 •
1
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