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CTL for test information of digital ICs
Record Type:
Electronic resources : Monograph/item
Title/Author:
CTL for test information of digital ICs/ by Rohit Kapur.
remainder title:
Core Test Language for test information of digital ICs
Author:
Kapur, Rohit.
Published:
Boston :Kluwer Academic Publishers, : c2003.,
Description:
ix, 173 p. :ill.
Subject:
Computer hardware description languages. -
Online resource:
https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=99315An electronic book accessible through the World Wide Web; click for information
ISBN:
0306478269 (electronic bk.)
CTL for test information of digital ICs
Kapur, Rohit.
CTL for test information of digital ICs
[electronic resource] /Core Test Language for test information of digital ICsby Rohit Kapur. - Boston :Kluwer Academic Publishers,c2003. - ix, 173 p. :ill.
Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2003.
Available via World Wide Web.
ISBN: 0306478269 (electronic bk.)Subjects--Topical Terms:
664267
Computer hardware description languages.
Index Terms--Genre/Form:
542853
Electronic books.
LC Class. No.: TK7874.65 / .K35 2003eb
Dewey Class. No.: 621.3815/48
CTL for test information of digital ICs
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Core Test Language for test information of digital ICs
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c2003.
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ix, 173 p. :
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ill.
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Boulder, Colo. :
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2003.
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Available via World Wide Web.
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Digital integrated circuits
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Testing
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https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=99315
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An electronic book accessible through the World Wide Web; click for information
994
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92
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AMF
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