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Nanoscale characterisation of ferroe...

Alexe, M.

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Nanoscale characterisation of ferroelectric materials : = scanning probe microscopy approach /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Nanoscale characterisation of ferroelectric materials :/ M. Alexe, A. Gruverman, eds.
其他題名:	scanning probe microscopy approach /
其他作者:	Alexe, M.
出版者:	Berlin ;Springer-Verlag, : c2004.,
面頁冊數:	xiii, 282 p. :ill. (some col.) ;24 cm.
叢書名:	Nanoscience and technology.
標題:	Nanostructured materials. -
ISBN:	3540206620 (hbk.) :

Nanoscale characterisation of ferroelectric materials : = scanning probe microscopy approach /
Nanoscale characterisation of ferroelectric materials :scanning probe microscopy approach /M. Alexe, A. Gruverman, eds. - Berlin ;Springer-Verlag,c2004. - xiii, 282 p. :ill. (some col.) ;24 cm. - Nanoscience and technology..

Includes bibliographical references and index.

ISBN: 3540206620 (hbk.) :EUR89.95

LCCN: 2004040666Subjects--Topical Terms:

584856
Nanostructured materials.

LC Class. No.: TA418.9.N35 / N3445 2004

Dewey Class. No.: 620/.5

Nanoscale characterisation of ferroelectric materials : = scanning probe microscopy approach /
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245 0 0 $a Nanoscale characterisation of ferroelectric materials : $b scanning probe microscopy approach / $c M. Alexe, A. Gruverman, eds.
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300 $a xiii, 282 p. : $b ill. (some col.) ; $c 24 cm.
440 0 $a Nanoscience and technology.
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650 $a Nanotechnology. $3 526235
700 $a Alexe, M. $q (Marin). $3 750271
700 $a Gruverman, A. $q (Alexei). $3 750272