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A guide to materials characterizatio...
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Sibilia, John P.
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A guide to materials characterization and chemical analysis /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
A guide to materials characterization and chemical analysis // edited by John P. Sibilia.
其他作者:
Sibilia, John P.
出版者:
New York :VCH, : c1996.,
面頁冊數:
xii, 388 p. :ill. ;24 cm.
內容註:
An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
標題:
Chemistry, Analytic. -
ISBN:
0471186333 :
A guide to materials characterization and chemical analysis /
A guide to materials characterization and chemical analysis /
edited by John P. Sibilia. - 2nd ed. - New York :VCH,c1996. - xii, 388 p. :ill. ;24 cm.
Includes bibliographical references and index.
An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
ISBN: 0471186333 :US104.95
LCCN: 96001306 //r98Subjects--Topical Terms:
517805
Chemistry, Analytic.
Subjects--Index Terms:
Chemical analysis.
LC Class. No.: QD75.2 / .G83 1996
Dewey Class. No.: 543
A guide to materials characterization and chemical analysis /
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Includes bibliographical references and index.
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An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry/ R. Donald Sedgewick and David M. Hindenlang -- Seperation techniques / Mina K. Gabriel ... [et al.] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy/ John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers/ Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation/ Willis B. Hammond and Jon M. Peltier.
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