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Analytical techniques for the charac...

Bastard, Gerald.

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Analytical techniques for the characterization of compound semiconductors : = proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Analytical techniques for the characterization of compound semiconductors :/ edited by G. Bastard and H. Oppolzer.
其他題名:	proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
其他作者:	Bastard, Gerald.
團體作者:	Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors
出版者:	Amsterdam ;North-Holland, : 1991.,
面頁冊數:	xvi, 537 p. :ill. ;27 cm.
叢書名:	European Materials Research Society symposia proceedings ;
標題:	Semiconductors - Analysis -
ISBN:	044489196X :

Analytical techniques for the characterization of compound semiconductors : = proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
Analytical techniques for the characterization of compound semiconductors :proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /edited by G. Bastard and H. Oppolzer. - Amsterdam ;North-Holland,1991. - xvi, 537 p. :ill. ;27 cm. - European Materials Research Society symposia proceedings ;v. 21.

Includes bibliographical references and indexes.

ISBN: 044489196X :UK326.00

LCCN: 91019416 //r93Subjects--Topical Terms:

698979
Semiconductors
--Analysis

LC Class. No.: QD139.S44 / A55 1990

Dewey Class. No.: 621.381/52

Analytical techniques for the characterization of compound semiconductors : = proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
LDR:00860cam a2200181 a 45 001 668313
005 19981202142517.2
008 910507s1991 ne a b 101 0 eng
010 $a 91019416 //r93
020 $a 044489196X : $c UK326.00
035 $a me 84000010
040 $a DLC $c DLC $d DLC
050 0 0 $a QD139.S44 $b A55 1990
082 0 0 $a 621.381/52 $2 20
111 $a Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors $d (1990 : $c Strasbourg, France) $3 698978
245 1 0 $a Analytical techniques for the characterization of compound semiconductors : $b proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 / $c edited by G. Bastard and H. Oppolzer.
260 0 $a Amsterdam ; $a New York : $c 1991. $b North-Holland,
300 $a xvi, 537 p. : $b ill. ; $c 27 cm.
440 0 $a European Materials Research Society symposia proceedings ; $v v. 21
504 $a Includes bibliographical references and indexes.
650 $a Semiconductors $x Analysis $x Congresses. $3 698979
650 $a Semiconductors $x Optical properties $x Congresses. $3 698980
700 $a Bastard, Gerald. $3 698977
700 $a Oppolzer, Helmut. $3 674242