東華大學圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館首頁

手機版館藏查詢

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Proceedings : = International Test C...

IEEE Computer Society., Test Technology Technical Committee.

FindBook

Google Book

Amazon

博客來

Proceedings : = International Test Conference 1993 /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Proceedings :/ [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
其他題名:	International Test Conference 1993 /
團體作者:	International Test Conference
出版者:	Altoona, PA :International Test Conference ; : c1993.,
面頁冊數:	xii, 1065 p. :ill. ;29 cm.
附註:	"IEEE catalog number 93CH3356-3"--T.p. verso.
標題:	Automatic checkout equipment - Congresses. -
ISBN:	0780314298 (soft)

Proceedings : = International Test Conference 1993 /
Proceedings :International Test Conference 1993 /[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]. - Altoona, PA :International Test Conference ;c1993. - xii, 1065 p. :ill. ;29 cm.

"IEEE catalog number 93CH3356-3"--T.p. verso.

Includes bibliographical references and index.

ISBN: 0780314298 (soft)

LCCN: 93080010Subjects--Topical Terms:

678617
Automatic checkout equipment
--Congresses.

LC Class. No.: TK7872.S4 / I6 1993 PROC.

Dewey Class. No.: 621.38173028 / In8t, 1993

Proceedings : = International Test Conference 1993 /
LDR:01198cam a2200277 a 45 001 666581
003 OCoLC
005 19990917134913.2
008 940118s1993 paua b 101 0 eng d
010 $a 93080010
020 $a 0780314298 (soft)
020 $a 0780314301 (case) : $c US100.00
020 $a 078031431X (microfiche)
035 $a dt 00015201
040 $a RBN $c RBN $d UNN $d UIU $d WAU $d TXH
050 $a TK7872.S4 $b I6 1993 PROC.
082 0 $a 621.38173028 $b In8t, 1993 $2 20
111 $a International Test Conference $n (24th : $d 1993 : $c Baltimore, Maryland, USA) $3 695880
245 1 0 $a Proceedings : $b International Test Conference 1993 / $c [sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section].
260 $a Altoona, PA : $a Piscataway, NJ : $c c1993. $b International Test Conference ; $b [Distributor] IEEE Service Center,
300 $a xii, 1065 p. : $b ill. ; $c 29 cm.
500 $a "IEEE catalog number 93CH3356-3"--T.p. verso.
500 $a "IEEE Computer Society press order number 4192-02"--T.p. verso.
500 $a Cover title: Designing, testing, and diagnostics-join them.
500 $a Spine title: International Test Conference 1993 : proceedings.
504 $a Includes bibliographical references and index.
650 $a Automatic checkout equipment $x Congresses. $3 678617
650 $a Integrated circuits $x Testing $x Congresses. $3 659601
650 $a Semiconductors $x Testing $x Congresses. $3 695881
710 $a IEEE Computer Society. $b Test Technology Technical Committee. $3 659597
710 $a Institute of Electrical and Electronics Engineers. $3 595741
740 0 1 $a Designing, testing, and diagnostics-join them.
740 0 1 $a International Test Conference 1993 : proceedings.