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Particle beam microanalysis : = fund...
~
Oppolzer, Helmut.
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Particle beam microanalysis : = fundamentals, methods, and applications /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Particle beam microanalysis :/ E. Fuchs, H. Oppolzer, H. Rehme.
Reminder of title:
fundamentals, methods, and applications /
Author:
Fuchs, Ekkehard.
other author:
Oppolzer, Helmut.
Published:
Weinheim, F.R.G. ;VCH, : 1990.,
Description:
xviii, 507 p. :ill. ;25 cm.
Subject:
Electron microscopy - Industrial applications. -
ISBN:
0895735059 (New York : alk. paper)
Particle beam microanalysis : = fundamentals, methods, and applications /
Fuchs, Ekkehard.
Particle beam microanalysis :
fundamentals, methods, and applications /E. Fuchs, H. Oppolzer, H. Rehme. - Weinheim, F.R.G. ;VCH,1990. - xviii, 507 p. :ill. ;25 cm.
Includes bibliographical references and index.
ISBN: 0895735059 (New York : alk. paper)
LCCN: 90012865Subjects--Topical Terms:
674245
Electron microscopy
--Industrial applications.
LC Class. No.: TA417.23 / .F83 1990
Dewey Class. No.: 620.1/127
Particle beam microanalysis : = fundamentals, methods, and applications /
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Fuchs, Ekkehard.
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Particle beam microanalysis :
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fundamentals, methods, and applications /
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E. Fuchs, H. Oppolzer, H. Rehme.
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Weinheim, F.R.G. ;
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New York, NY, USA :
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1990.
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VCH,
300
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xviii, 507 p. :
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ill. ;
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25 cm.
504
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Includes bibliographical references and index.
650
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Electron microscopy
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Industrial applications.
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674245
650
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Materials
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Microscopy.
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559323
700
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Oppolzer, Helmut.
$3
674242
700
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Rehme, Hans.
$3
674243
based on 0 review(s)
Location:
ALL
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
Year:
Volume Number:
Items
1 records • Pages 1 •
1
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W0100580
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
01.外借(書)_YB
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TA417.23 F951 1990
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1 records • Pages 1 •
1
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