語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
Integration of test with design and ...
~
IEEE Computer Society., Test Technology Technical Committee.
FindBook
Google Book
Amazon
博客來
Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Integration of test with design and manufacturing :/ sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
其他題名:
September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
團體作者:
International Test Conference
出版者:
Washington, D.C. :Computer Society Press of the IEEE ; : c1987.,
面頁冊數:
xxxi, 1151 p. :ill. ;28 cm.
附註:
"Computer Society order no. 789."
標題:
Electronic digital computers -
ISBN:
081860798X (pbk.) :
Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
Integration of test with design and manufacturing :
September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /sponsored by the IEEE Computer Society, IEEE Philadelphia Section. - Washington, D.C. :Computer Society Press of the IEEE ;c1987. - xxxi, 1151 p. :ill. ;28 cm.
"Computer Society order no. 789."
Includes bibliographies and index.
ISBN: 081860798X (pbk.) :US180.00
LCCN: 87080439Subjects--Topical Terms:
659600
Electronic digital computers
LC Class. No.: TK7874 / .I593 1987
Dewey Class. No.: 621.381/73
Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
LDR
:00994nam a2200241 a 45
001
648110
005
19990917133405.0
008
880914s1987 dcua b 10110 eng
010
$a
87080439
020
$a
081860798X (pbk.) :
$c
US180.00
020
$a
0818647981 (microfiche)
020
$a
0818687983 (case)
035
$a
dt 00008128
040
$a
NDHU
$c
NDHU
$d
NDHU
050
0
$a
TK7874
$b
.I593 1987
082
0
$a
621.381/73
$2
19
111
$a
International Test Conference
$n
(18th :
$d
1987 :
$c
Washington, D.C.)
$3
659599
245
1 0
$a
Integration of test with design and manufacturing :
$b
September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
$c
sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
260
0
$a
Washington, D.C. :
$a
Los Angeles, CA :
$c
c1987.
$b
Computer Society Press of the IEEE ;
$b
Order from Computer Society of the IEEE,
300
$a
xxxi, 1151 p. :
$b
ill. ;
$c
28 cm.
500
$a
"Computer Society order no. 789."
500
$a
"IEEE catalog no. 87CH2347-2."
500
$a
Spine title: International Test Conference 1987 : proceedings.
504
$a
Includes bibliographies and index.
650
$a
Electronic digital computers
$3
659600
650
$a
Integrated circuits
$x
Testing
$x
Congresses.
$3
659601
710
$a
IEEE Computer Society.
$b
Test Technology Technical Committee.
$3
659597
710
$a
Institute of Electrical and Electronics Engineers.
$b
Philadelphia Section.
$3
659598
740
0 1
$a
International Test Conference 1987 : proceedings.
筆 0 讀者評論
館藏地:
全部
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W0018946
罕用書庫221室(美崙校區,調書請點預約)(RU_221)
01.外借(書)_YB
一般圖書
TK7874 I593 1987
一般使用(Normal)
在架
0
預約
1 筆 • 頁數 1 •
1
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入