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All-Optical Nanothermometry of Isola...

Bommidi, Dinesh Kumar,

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All-Optical Nanothermometry of Isolated Hotspots Using NV Centers in Individual Nanodiamonds /

Record Type:	Electronic resources : Monograph/item
Title/Author:	All-Optical Nanothermometry of Isolated Hotspots Using NV Centers in Individual Nanodiamonds // Dinesh Kumar Bommidi.
Author:	Bommidi, Dinesh Kumar,
Description:	1 electronic resource (115 pages)
Notes:	Source: Dissertations Abstracts International, Volume: 85-08, Section: B.
Contained By:	Dissertations Abstracts International85-08B.
Subject:	Mechanical engineering. -
Online resource:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30993575
ISBN:	9798381723625

All-Optical Nanothermometry of Isolated Hotspots Using NV Centers in Individual Nanodiamonds /
Bommidi, Dinesh Kumar,

All-Optical Nanothermometry of Isolated Hotspots Using NV Centers in Individual Nanodiamonds /Dinesh Kumar Bommidi. - 1 electronic resource (115 pages)

Source: Dissertations Abstracts International, Volume: 85-08, Section: B.

Nanothermometry involves measuring temperatures at hotspots confined to small regions with dimensions ≤100 nm. Nanoscale components within modern electronics can reach high temperatures, leading to rapid thermal deterioration or unreliable operation. Consequently, the demand for thermometry with sub-100 ns resolution, coupled with sub-100 nm spatial resolution, has significantly increased. We have developed an all-optical single-point thermometry technique, where we can accurately place a nanosensor at critical locations through atomic force microscope-based nanomanipulation, achieving spatial resolution equivalent to the nanosensor size.With their temperature-dependent fluorescence lifetime on the order of tens of nanoseconds, nitrogen-vacancy (NV) centers in individual nanodiamonds (NDs) are excellent candidates to achieve sub-100 ns temporal resolution. We conducted time-correlated single photon counting (TCSPC) measurements on silicon and glass substrates across a temperature range from 300 K to ~500 K. Our findings revealed a decrease in the lifetime of NV center emission with increasing temperature. Additionally, we observed variations in room-temperature lifetime values among individual NDs from the same batch. At 500 K, the average decrease in lifetime values was 32 ± 7.0% for NDs on silicon and 35 ± 8.3% for NDs on glass relative to their values at 300 K. Furthermore, most of the NDs emitted > 1000 counts/second at 500 K, which is ~10x the detection limit of our system.We are also utilizing single-point nanothermometry to experimentally verify decades-old predictions regarding sub-continuum heat dissipation from a nanoscale heat source. Optically levitated individual NDs containing NV centers serve as combined nanoheaters/sensors, where the fluorescence spectra can be employed to measure the temperature of the NDs. For this purpose, we utilize optical Debye-Waller Factor (DWF) thermometry, which provides a more suitable all-optical temperature-dependent signal. Calibration of the DWF versus temperature is conducted outside the optical trap. Subsequently, these DWF values are utilized to determine the temperature of optically levitated NDs from the same batch. With a reduction in pressure, the heat transfer to the rarefied gas decreases, resulting in an increase in the temperature of the ND by over 200 K. Overall, both the DWF and lifetime nanothermometry techniques exhibit broad applicability with minimal effects on the sample surface.

English

ISBN: 9798381723625Subjects--Topical Terms:

649730
Mechanical engineering.
Subjects--Index Terms:

all-optical

All-Optical Nanothermometry of Isolated Hotspots Using NV Centers in Individual Nanodiamonds /
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520 $a Nanothermometry involves measuring temperatures at hotspots confined to small regions with dimensions ≤100 nm. Nanoscale components within modern electronics can reach high temperatures, leading to rapid thermal deterioration or unreliable operation. Consequently, the demand for thermometry with sub-100 ns resolution, coupled with sub-100 nm spatial resolution, has significantly increased. We have developed an all-optical single-point thermometry technique, where we can accurately place a nanosensor at critical locations through atomic force microscope-based nanomanipulation, achieving spatial resolution equivalent to the nanosensor size.With their temperature-dependent fluorescence lifetime on the order of tens of nanoseconds, nitrogen-vacancy (NV) centers in individual nanodiamonds (NDs) are excellent candidates to achieve sub-100 ns temporal resolution. We conducted time-correlated single photon counting (TCSPC) measurements on silicon and glass substrates across a temperature range from 300 K to ~500 K. Our findings revealed a decrease in the lifetime of NV center emission with increasing temperature. Additionally, we observed variations in room-temperature lifetime values among individual NDs from the same batch. At 500 K, the average decrease in lifetime values was 32 ± 7.0% for NDs on silicon and 35 ± 8.3% for NDs on glass relative to their values at 300 K. Furthermore, most of the NDs emitted > 1000 counts/second at 500 K, which is ~10x the detection limit of our system.We are also utilizing single-point nanothermometry to experimentally verify decades-old predictions regarding sub-continuum heat dissipation from a nanoscale heat source. Optically levitated individual NDs containing NV centers serve as combined nanoheaters/sensors, where the fluorescence spectra can be employed to measure the temperature of the NDs. For this purpose, we utilize optical Debye-Waller Factor (DWF) thermometry, which provides a more suitable all-optical temperature-dependent signal. Calibration of the DWF versus temperature is conducted outside the optical trap. Subsequently, these DWF values are utilized to determine the temperature of optically levitated NDs from the same batch. With a reduction in pressure, the heat transfer to the rarefied gas decreases, resulting in an increase in the temperature of the ND by over 200 K. Overall, both the DWF and lifetime nanothermometry techniques exhibit broad applicability with minimal effects on the sample surface.
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