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Fabrication and Characterization of ...

Pan, Shuhang,

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Fabrication and Characterization of Chalcogenide and Oxide Thin Films /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Fabrication and Characterization of Chalcogenide and Oxide Thin Films // Shuhang Pan.
Author:	Pan, Shuhang,
Description:	1 electronic resource (147 pages)
Notes:	Source: Dissertations Abstracts International, Volume: 86-12, Section: B.
Contained By:	Dissertations Abstracts International86-12B.
Subject:	Condensed matter physics. -
Online resource:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=31843891
ISBN:	9798286443659

Fabrication and Characterization of Chalcogenide and Oxide Thin Films /
Pan, Shuhang,

Fabrication and Characterization of Chalcogenide and Oxide Thin Films /Shuhang Pan. - 1 electronic resource (147 pages)

Source: Dissertations Abstracts International, Volume: 86-12, Section: B.

This dissertation explores the fabrication, structural characterization, and quantum transport properties of chalcogenide and oxide thin films. High-quality SnTe films were synthesized via molecular beam epitaxy (MBE), demonstrating tunable topological surface states through nanoscale patterning. Magnetoconductivity measurements revealed weak antilocalization (WAL) effects across continuous and patterned films, with coherence lengths governed by boundary scattering in hole-patterned geometries. Advanced focused ion beam (FIB) protocols enabled atomic-resolution transmission electron microscopy (TEM) of monolayer ZrO2 on silicon, defect distribution in off-stoichiometric CaWO4 films and orientation analysis in YVO4 thin films. Josephson junctions fabricated on superconducting Nd1−xEuxNiO2 thin films exhibited macroscopic quantum transport behavior. By integrating nanofabrication with multi-scale characterization, this work establishes design principles for investigating quantum phenomena in low-dimensional systems, advancing applications in topological electronics and superconducting devices.

English

ISBN: 9798286443659Subjects--Topical Terms:

3173567
Condensed matter physics.
Subjects--Index Terms:

Chalcogenide thin film

Fabrication and Characterization of Chalcogenide and Oxide Thin Films /
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500 $a Source: Dissertations Abstracts International, Volume: 86-12, Section: B.
500 $a Advisors: Ahn, Charles Committee members: Walker, Frederick; He, Yu; Su, Cong; Albright, Stephen.
502 $b Ph.D. $c Yale University $d 2025.
520 $a This dissertation explores the fabrication, structural characterization, and quantum transport properties of chalcogenide and oxide thin films. High-quality SnTe films were synthesized via molecular beam epitaxy (MBE), demonstrating tunable topological surface states through nanoscale patterning. Magnetoconductivity measurements revealed weak antilocalization (WAL) effects across continuous and patterned films, with coherence lengths governed by boundary scattering in hole-patterned geometries. Advanced focused ion beam (FIB) protocols enabled atomic-resolution transmission electron microscopy (TEM) of monolayer ZrO2 on silicon, defect distribution in off-stoichiometric CaWO4 films and orientation analysis in YVO4 thin films. Josephson junctions fabricated on superconducting Nd1−xEuxNiO2 thin films exhibited macroscopic quantum transport behavior. By integrating nanofabrication with multi-scale characterization, this work establishes design principles for investigating quantum phenomena in low-dimensional systems, advancing applications in topological electronics and superconducting devices.
546 $a English
590 $a School code: 0265
650 4 $a Condensed matter physics. $3 3173567
650 4 $a Molecular physics. $3 3174737
650 4 $a Physics. $3 516296
650 4 $a Nanoscience. $3 587832
653 $a Chalcogenide thin film
653 $a Nanofabrication
653 $a Oxide thin film
653 $a Transmission electron microscopy
653 $a Topological crystalline insulator
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690 $a 0565
690 $a 0605
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791 $a Ph.D.
792 $a 2025
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