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X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces = = Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi /

Record Type:	Electronic resources : Monograph/item
Title/Author:	X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces =/ Pinar Aydogan Gokturk.
Reminder of title:	Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi /
Author:	Gokturk, Pinar Aydogan,
Description:	1 electronic resource (139 pages)
Notes:	Source: Dissertations Abstracts International, Volume: 83-10, Section: B.
Contained By:	Dissertations Abstracts International83-10B.
Subject:	Energy. -
Online resource:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=29046964
ISBN:	9798209968597

X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces = = Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi /
Gokturk, Pinar Aydogan,

X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces =Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi /Pinar Aydogan Gokturk. - 1 electronic resource (139 pages)

Source: Dissertations Abstracts International, Volume: 83-10, Section: B.

Understanding of electrical and electrochemical devices in operating conditions is vital for development of new technologies. Many important characteristics that determine the performance of such devices lie on their surfaces and interfaces which significantly deviate from the bulk properties. However, particularly for the liquid based devices, carrying out surface analysis is challenging and requires highly sophisticated instrumentation. In this PhD. thesis, we aim to unravel the potential development on liquids, dielectrics as well as the liquid/solid interfaces during AC and DC excitation in a chemically resolved fashion using the UHV compatible non-aqueous liquids in a basic electrowetting on dielectrics configuration within X-Ray Photoelectron Spectroscopy (XPS) chamber. Low molecular weight Polyethylene glycol (PEG) and a particular ionic liquid Diethylmethyl(2-methoxyethyl)ammonium bis(trifluoromethylsulfonyl)imide [DEME][TFSI] are used to represent two extreme cases as being non-ionic and fully-ionic liquids. Application of external electrical bias to these devices either from the top or the bottom electrode during data acquisition enabled us to investigate the electrowetting phenomenon, in a chemically addressed fashionIn the first part of the thesis, geometrical changes that the drop undergoes during electrowetting have been monitored both by steady state areal maps and by dynamic XPS point analysis where the potential was altered periodically.In the second part, we have focused only on the DC electrowetting of liquids. We probed the potential developments in the dielectric layer and on the liquid by monitoring the changes in the binding energy of the representative XPS peaks with respect to the applied potential. We showed that the conductivity of the liquid has no influence on the potential and the entire potential drop occurs at the liquid/dielectric interface. Dielectric breakdown and its effect on the potential developments were also investigated in this part.In the third part, we have tried to understand the frequency dependent potential developments of the ionic liquid and the polyethylene glycol based EWOD devices by AC electrowetting. Our time dependent XPS measurements under AC excitation with sweeping frequency have demonstrated that EWOD devices exhibit two different behaviors separated by a critical frequency, which is dependent on the AC resistance (impedance) or ionic content of the liquid and also the electrical characteristics of the dielectric layer. Below the critical frequency, XPS spectra are mainly affected by the capacitive component of the dielectric, hence the liquid completely screens the applied electrical field. However, for frequencies above the critical, the resistive component of the liquid dominates and the drop behaves like a resistive strip, resulting in the formation of equipotential surface contours which are shown experimentally for the first time in this study.In the last part of the thesis, an equivalent circuit model was developed to electrically describe the electrowetting behavior of PEG on dielectric and also to generate a solid-state mimicking device to produce the same XPS spectral observations.

English

ISBN: 9798209968597Subjects--Topical Terms:

876794
Energy.

X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces = = Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi /
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100 1 $a Gokturk, Pinar Aydogan, $e author. $3 3823830
245 1 0 $a X-Ray Photoelectron Spectroscopy for Chemical and Electrical Characterization of Devices Extended to Liquid/Solid Interfaces = $b Aygitlarin Elektriksel ve Kimyasal Analizleri Icin X-Isini Fotoelektron Spektroskopisinin Sivi/Kati Arayuzeylerini de Kapsayacak Sekilde Genisletilmesi / $c Pinar Aydogan Gokturk.
264 1 $a Ann Arbor : $b ProQuest Dissertations & Theses, $c 2018
300 $a 1 electronic resource (139 pages)
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500 $a Source: Dissertations Abstracts International, Volume: 83-10, Section: B.
500 $a Advisors: Suzer, Sefik.
502 $b Ph.D. $c Bilkent Universitesi (Turkey) $d 2018.
520 $a Understanding of electrical and electrochemical devices in operating conditions is vital for development of new technologies. Many important characteristics that determine the performance of such devices lie on their surfaces and interfaces which significantly deviate from the bulk properties. However, particularly for the liquid based devices, carrying out surface analysis is challenging and requires highly sophisticated instrumentation. In this PhD. thesis, we aim to unravel the potential development on liquids, dielectrics as well as the liquid/solid interfaces during AC and DC excitation in a chemically resolved fashion using the UHV compatible non-aqueous liquids in a basic electrowetting on dielectrics configuration within X-Ray Photoelectron Spectroscopy (XPS) chamber. Low molecular weight Polyethylene glycol (PEG) and a particular ionic liquid Diethylmethyl(2-methoxyethyl)ammonium bis(trifluoromethylsulfonyl)imide [DEME][TFSI] are used to represent two extreme cases as being non-ionic and fully-ionic liquids. Application of external electrical bias to these devices either from the top or the bottom electrode during data acquisition enabled us to investigate the electrowetting phenomenon, in a chemically addressed fashionIn the first part of the thesis, geometrical changes that the drop undergoes during electrowetting have been monitored both by steady state areal maps and by dynamic XPS point analysis where the potential was altered periodically.In the second part, we have focused only on the DC electrowetting of liquids. We probed the potential developments in the dielectric layer and on the liquid by monitoring the changes in the binding energy of the representative XPS peaks with respect to the applied potential. We showed that the conductivity of the liquid has no influence on the potential and the entire potential drop occurs at the liquid/dielectric interface. Dielectric breakdown and its effect on the potential developments were also investigated in this part.In the third part, we have tried to understand the frequency dependent potential developments of the ionic liquid and the polyethylene glycol based EWOD devices by AC electrowetting. Our time dependent XPS measurements under AC excitation with sweeping frequency have demonstrated that EWOD devices exhibit two different behaviors separated by a critical frequency, which is dependent on the AC resistance (impedance) or ionic content of the liquid and also the electrical characteristics of the dielectric layer. Below the critical frequency, XPS spectra are mainly affected by the capacitive component of the dielectric, hence the liquid completely screens the applied electrical field. However, for frequencies above the critical, the resistive component of the liquid dominates and the drop behaves like a resistive strip, resulting in the formation of equipotential surface contours which are shown experimentally for the first time in this study.In the last part of the thesis, an equivalent circuit model was developed to electrically describe the electrowetting behavior of PEG on dielectric and also to generate a solid-state mimicking device to produce the same XPS spectral observations.
520 $a Elektriksel ve elektrokimyasal aygitlari calisma kosullarinda incelemek, yeni teknolojilerin gelistirilmesi icin hayati onem tasimaktadir. Bu tur aygitlarin performansini belirleyen bircok onemli ozellikleri, geri kalan kutle ile onemli olcude farkliliklar gostermekte olan yuzey ve ara yuzleri tarafindan kontrol edilmektedir. Ancak, ozellikle sivi bazli aygitlar icin, yuzey analizi yapmak zordur ve oldukca gelismis enstrumantasyon gerektirmektedir. Bu doktora tez calismasinda, X-isini fotoelektron cihazi icinde, geleneksel dielektrik malzemeler uzerindeki elektroislanma konfigurasyonunda cok yuksek vakum uyumlu ve sulu olmayan sivilar kullanilarak, alternatif ve dogru akim altinda sivi, dielektrik ve sivi/kati arayuzler uzerindeki potansiyel olusumlarin kimyasal cozunurlukle incelenmesi amaclanmistir. Dusuk molekuler agirliktaki polietilen-glikol (PEG) ve ozel bir iyonik sivi (DEME-TFSI) kullanilarak iyonik olmayan ve tamamen iyonik olan sivilar olmak uzere iki uc noktayi temsil eden sivilar incelenmistir. Veri toplanmasi sirasinda ust ya da alt vii elektrottan aygitlara harici bir elektriksel potansiyel uygulanarak, bu potansiyelin kimyasal olarak adreslenmis bir sekilde olculebilmesi, elektro-islanma olayini hem kimyasal hem de elektriksel boyutlardan incelenebilmesini saglamistir.Tezin ilk bolumunde, elektro islanma sirasinda damlacikta meydana gelen geometrik degisiklikler, hem duragan alansal taramalar, hem de potansiyelin periyodik olarak degistirildigi dinamik XPS nokta analizleri ile izlenmistir.Ikinci bolumde, sivilarin sadece DC altindaki elektro-islanmalarina odaklanilmistir. Hem siviyi hem de dielektrik alt tasini temsil eden XPS tepelerinin baglanma enerjisindeki degisimler, disaridan uygulanan elektriksel potansiyele gore izlenerek, hem dielektrik tabakadaki, hem de sivinin degisik bolgelerindeki potansiyel gelismeleri tespit edilmistir. Sivinin iletkenliginin, sivi/dielektrik ara yuzeyinde meydana gelen potansiyel dagilimi uzerinde hicbir etkisinin olmadigi gosterilmistir. Ayrica, dielektrik bozulma ve bunun sivi uzerindeki potansiyel gelisimi uzerine etkisi de bu bolumde incelenmistir.Ucuncu bolumde, iyonik sivi ve polietilen glikol bazli aygitlarin frekansa bagli AC elektro-islanma sirasindaki potansiyel gelismeleri incelenmistir. AC uyarimi altinda frekans taramasi ile yapilan zamana bagli XPS olcumleri; aygitlarin, sivinin direncine veya iyonik icerigine ve ayrica dielektrik tabakanin elektriksel ozelliklerine bagli olan kritik bir frekansla ayrilan, iki farkli davranis sergiledigini gostermistir. Kritik frekanstan dusuk degerlerde, XPS spektrumlari esas olarak dielektrigin kapasitif bileseni tarafindan belirlenmekte olup, dolayisiyla sivi uygulanan elektrik alanini tamamen bloke etmektedir. Bununla birlikte, kritigin uzerindeki frekanslar viii icin, sivinin direnci baskindir ve damla, bir direnc seridi gibi davranmaktadir. Bu davranisin sonucunda olusan es potansiyel yuzey konturlari da ilk kez deneysel olarak bu calismada gosterilmistir.Tezin son bolumunde, arastirilan sistemi elektriksel olarak tanimlamak ve ayni XPS spektral gozlemini tekrarlayabilmek icin kullanilacak olan ve kati hal direnc ve kapasitorlerden olusan bir taklit cihaz uretmek icin esdeger bir devre modeli gelistirilmistir.
546 $a English
590 $a School code: 1159
650 4 $a Energy. $3 876794
650 4 $a Polyethylene glycol. $3 3686750
650 4 $a X-rays. $3 604695
650 4 $a Plastics. $3 649803
650 4 $a Polymer chemistry. $3 3173488
690 $a 0791
690 $a 0795
690 $a 0495
710 2 $a Bilkent Universitesi (Turkey). $e degree granting institution. $3 3767555
720 1 $a Suzer, Sefik $e degree supervisor.
773 0 $t Dissertations Abstracts International $g 83-10B.
790 $a 1159
791 $a Ph.D.
792 $a 2018
856 4 0 $u https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=29046964