Optical characterization of microstr...
Xu, Shijie.

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  • Optical characterization of microstructures and optoelectronic devices based on wide band gap semiconductors
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Optical characterization of microstructures and optoelectronic devices based on wide band gap semiconductors/ edited by Shijie Xu.
    other author: Xu, Shijie.
    Published: Singapore :Springer Nature Singapore : : 2025.,
    Description: xii, 373 p. :ill., digital ;24 cm.
    [NT 15003449]: Wide band gap semiconductor laser technology and characterization -- Growth and characterization of GaN-based lasers on silicon substrates -- Efficiency characterization of GaN-based LEDs -- Preparation and optoelectronic properties of GaN-based Micro-LEDs -- Key factors restricting the external quantum efficiency of GaN-based micro-LEDsand solutions -- Growth and optical characterization of non-polar and semi-polar GaN-based LEDs -- Construction and characterization of ZnO micro-nano lasers -- Ga2O3 solar blind deep ultraviolet detectors -- Optoelectronic properties and characterization of gallium-doped ZnO -- Optoelectronic process characterization of localized carriers in semiconductors and photovoltaic devices -- Photoluminescence properties and characterization of InGaN/GaN nanowire quantum dots -- Characterization of nonlinear optical properties of ZnO single crystals and micro-nano structures.
    Contained By: Springer Nature eBook
    Subject: Wide gap semiconductors. -
    Online resource: https://doi.org/10.1007/978-981-95-1928-6
    ISBN: 9789819519286
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