東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

Linked to FindBook

Google Book

Amazon

博客來

X-ray scattering techniques for epitaxial oxide thin films

Record Type:	Electronic resources : Monograph/item
Title/Author:	X-ray scattering techniques for epitaxial oxide thin films/ edited by Daniel Sando, Paul G. Evans, Nagarajan Valanoor.
other author:	Sando, Daniel.
Published:	Singapore :Springer Nature Singapore : : 2025.,
Description:	vii, 186 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction to oxide thin films and context -- Laboratory-based x-ray diffraction techniques for thin films -- Synchrotron techniques to map ferroelectric domain structures including superlattices -- Coherent X-ray methods -- Magnetic scattering and dichroism techniques -- Probing oxygen octahedra and weak ordering phenomena -- Time-resolved x-ray scattering techniques -- Future developments and perspectives.
Contained By:	Springer Nature eBook
Subject:	X-rays - Scattering -
Online resource:	https://doi.org/10.1007/978-981-96-5945-6
ISBN:	9789819659456

X-ray scattering techniques for epitaxial oxide thin films
X-ray scattering techniques for epitaxial oxide thin films[electronic resource] /edited by Daniel Sando, Paul G. Evans, Nagarajan Valanoor. - Singapore :Springer Nature Singapore :2025. - vii, 186 p. :ill., digital ;24 cm.

Introduction to oxide thin films and context -- Laboratory-based x-ray diffraction techniques for thin films -- Synchrotron techniques to map ferroelectric domain structures including superlattices -- Coherent X-ray methods -- Magnetic scattering and dichroism techniques -- Probing oxygen octahedra and weak ordering phenomena -- Time-resolved x-ray scattering techniques -- Future developments and perspectives.

This book acts as a handbook on the topic of x-ray scattering as applied to epitaxial complex oxide films, providing detailed information to collect the data, how to analyze the data and the practical sides of the experiments. The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction. The subsequent chapters focus on advanced techniques that are typically performed at large-scale facilities such as synchrotrons: diffuse scattering and strain mapping, coherent X-ray methods, magnetic X-ray scattering and dichroism effects, and pump-probe techniques. In addition, detailed characterization methods for complex structures such as oxide superlattices, the measurement of oxygen octahedra rotations, and probing of domain arrangements are covered. The overarching aim of the book is to provide a tutorial-style approach to assist experimentalists actually carrying out their experiments and data analysis. (For instance, the nitty gritty techniques of alignment and experimental setup, along with common mistakes and pitfalls, are often not discussed in textbooks or instruction manuals.). The book is an invaluable tool for the wide range of researchers working globally on 'oxide electronics,' serves as a reference text for the many and varied techniques applied to such materials systems, and showcases new advanced methods in x-ray scattering.

ISBN: 9789819659456

Standard No.: 10.1007/978-981-96-5945-6doiSubjects--Topical Terms:

3790553
X-rays
--Scattering

LC Class. No.: TA418.9.T45

Dewey Class. No.: 621.38152

X-ray scattering techniques for epitaxial oxide thin films
LDR:03013nmm a2200325 a 4500 001 2414079
003 DE-He213
005 20250812130233.0
006 m d
007 cr nn 008maaau
008 260205s2025 si s 0 eng d
020 $a 9789819659456 $q (electronic bk.)
020 $a 9789819659449 $q (paper)
024 7 $a 10.1007/978-981-96-5945-6 $2 doi
035 $a 978-981-96-5945-6
040 $a GP $c GP
041 0 $a eng
050 4 $a TA418.9.T45
072 7 $a TGMT $2 bicssc
072 7 $a SCI016000 $2 bisacsh
072 7 $a TGMT $2 thema
082 0 4 $a 621.38152 $2 23
090 $a TA418.9.T45 $b X1 2025
245 0 0 $a X-ray scattering techniques for epitaxial oxide thin films $h [electronic resource] / $c edited by Daniel Sando, Paul G. Evans, Nagarajan Valanoor.
260 $a Singapore : $b Springer Nature Singapore : $b Imprint: Springer, $c 2025.
300 $a vii, 186 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction to oxide thin films and context -- Laboratory-based x-ray diffraction techniques for thin films -- Synchrotron techniques to map ferroelectric domain structures including superlattices -- Coherent X-ray methods -- Magnetic scattering and dichroism techniques -- Probing oxygen octahedra and weak ordering phenomena -- Time-resolved x-ray scattering techniques -- Future developments and perspectives.
520 $a This book acts as a handbook on the topic of x-ray scattering as applied to epitaxial complex oxide films, providing detailed information to collect the data, how to analyze the data and the practical sides of the experiments. The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction. The subsequent chapters focus on advanced techniques that are typically performed at large-scale facilities such as synchrotrons: diffuse scattering and strain mapping, coherent X-ray methods, magnetic X-ray scattering and dichroism effects, and pump-probe techniques. In addition, detailed characterization methods for complex structures such as oxide superlattices, the measurement of oxygen octahedra rotations, and probing of domain arrangements are covered. The overarching aim of the book is to provide a tutorial-style approach to assist experimentalists actually carrying out their experiments and data analysis. (For instance, the nitty gritty techniques of alignment and experimental setup, along with common mistakes and pitfalls, are often not discussed in textbooks or instruction manuals.). The book is an invaluable tool for the wide range of researchers working globally on 'oxide electronics,' serves as a reference text for the many and varied techniques applied to such materials systems, and showcases new advanced methods in x-ray scattering.
650 0 $a X-rays $x Scattering $x Technique. $3 3790553
650 0 $a Oxide coating. $3 2058737
650 1 4 $a Crystallography and Scattering Methods. $3 3218070
650 2 4 $a Surface and Interface and Thin Film. $3 3593579
650 2 4 $a Surfaces, Interfaces and Thin Film. $3 3593580
700 1 $a Sando, Daniel. $3 3790550
700 1 $a Evans, Paul G. $3 3790551
700 1 $a Valanoor, N. $3 3790552
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-981-96-5945-6
950 $a Chemistry and Materials Science (SpringerNature-11644)