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Fundamentals of electromigration-aware integrated circuit design

Record Type:	Electronic resources : Monograph/item
Title/Author:	Fundamentals of electromigration-aware integrated circuit design/ by Jens Lienig, Susann Rothe, Matthias Thiele.
Author:	Lienig, Jens.
other author:	Rothe, Susann.
Published:	Cham :Springer Nature Switzerland : : 2025.,
Description:	xv, 167 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction -- Fundamentals of Electromigration -- Integrated Circuit Design and Electromigration -- Mitigating Electromigration in Physical Design -- Summary and Outlook.
Contained By:	Springer Nature eBook
Subject:	Integrated circuits - Design and construction. -
Online resource:	https://doi.org/10.1007/978-3-031-80023-8
ISBN:	9783031800238

Fundamentals of electromigration-aware integrated circuit design
Lienig, Jens.

Fundamentals of electromigration-aware integrated circuit design[electronic resource] /by Jens Lienig, Susann Rothe, Matthias Thiele. - Second edition. - Cham :Springer Nature Switzerland :2025. - xv, 167 p. :ill., digital ;24 cm.

Introduction -- Fundamentals of Electromigration -- Integrated Circuit Design and Electromigration -- Mitigating Electromigration in Physical Design -- Summary and Outlook.

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability. Contents Introduction - Fundamentals of Electromigration - Integrated Circuit Design and Electromigration - Mitigating Electromigration in Physical Design - Summary and Outlook "This improved, second edition of the book provides the fundamental science necessary for a sound grounding from which to make practical use of the complete and indispensable application-oriented information regarding the electromigration-aware design of electronic systems. It is a foundational reference for today's design professionals, as well as for the next generation of engineering students." Prof. Worthy Martin, Emeritus Associate Professor of Computer Science, University of Virginia "This is a long-awaited book bridging the design and reliability methodologies imperative for generating robust and high-performing semiconductor devices. A deep insight into physics of the electromigration induced degradation of on-chip interconnect components as well as explaining a design specific failure development are beneficial for both the chip-design and materials engineering communities." Dr. Valeriy Sukharev, Chief Scientist, Siemens EDA "This book summarizes our current understanding of electromigration and how its effects can be moderated in practice. Particularly important and valuable are techniques that can address electromigration in modern automated design flows." Dr. Igor Markov, Distinguished Architect, Synopsys, Inc.

ISBN: 9783031800238

Standard No.: 10.1007/978-3-031-80023-8doiSubjects--Topical Terms:

658490
Integrated circuits
--Design and construction.

LC Class. No.: TK7874

Dewey Class. No.: 621.3815

Fundamentals of electromigration-aware integrated circuit design
LDR:03246nmm a2200337 a 4500 001 2409089
003 DE-He213
005 20250226115231.0
006 m d
007 cr nn 008maaau
008 260204s2025 sz s 0 eng d
020 $a 9783031800238 $q (electronic bk.)
020 $a 9783031800221 $q (paper)
024 7 $a 10.1007/978-3-031-80023-8 $2 doi
035 $a 978-3-031-80023-8
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
090 $a TK7874 $b .L719 2025
100 1 $a Lienig, Jens. $3 3236437
245 1 0 $a Fundamentals of electromigration-aware integrated circuit design $h [electronic resource] / $c by Jens Lienig, Susann Rothe, Matthias Thiele.
250 $a Second edition.
260 $a Cham : $b Springer Nature Switzerland : $b Imprint: Springer, $c 2025.
300 $a xv, 167 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- Fundamentals of Electromigration -- Integrated Circuit Design and Electromigration -- Mitigating Electromigration in Physical Design -- Summary and Outlook.
520 $a The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability. Contents Introduction - Fundamentals of Electromigration - Integrated Circuit Design and Electromigration - Mitigating Electromigration in Physical Design - Summary and Outlook "This improved, second edition of the book provides the fundamental science necessary for a sound grounding from which to make practical use of the complete and indispensable application-oriented information regarding the electromigration-aware design of electronic systems. It is a foundational reference for today's design professionals, as well as for the next generation of engineering students." Prof. Worthy Martin, Emeritus Associate Professor of Computer Science, University of Virginia "This is a long-awaited book bridging the design and reliability methodologies imperative for generating robust and high-performing semiconductor devices. A deep insight into physics of the electromigration induced degradation of on-chip interconnect components as well as explaining a design specific failure development are beneficial for both the chip-design and materials engineering communities." Dr. Valeriy Sukharev, Chief Scientist, Siemens EDA "This book summarizes our current understanding of electromigration and how its effects can be moderated in practice. Particularly important and valuable are techniques that can address electromigration in modern automated design flows." Dr. Igor Markov, Distinguished Architect, Synopsys, Inc.
650 0 $a Integrated circuits $x Design and construction. $3 658490
650 1 4 $a Electronic Circuits and Systems. $3 3538814
650 2 4 $a Processor Architectures. $3 892680
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
700 1 $a Rothe, Susann. $3 3782075
700 1 $a Thiele, Matthias. $3 3301980
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-031-80023-8
950 $a Engineering (SpringerNature-11647)