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Single-event effects, from space to ...

Aguiar, Ygor Quadros de.

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Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Single-event effects, from space to accelerator environments/ by Ygor Quadros de Aguiar ... [et al.].
Reminder of title:	analysis, prediction and hardening by design /
other author:	Aguiar, Ygor Quadros de.
Published:	Cham :Springer International Publishing : : 2025.,
Description:	x, 141 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Radiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives.
Contained By:	Springer Nature eBook
Subject:	Electronic apparatus and appliances - Effect of radiation on. -
Online resource:	https://doi.org/10.1007/978-3-031-71723-9
ISBN:	9783031717239

Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /
Single-event effects, from space to accelerator environmentsanalysis, prediction and hardening by design /[electronic resource] :by Ygor Quadros de Aguiar ... [et al.]. - Cham :Springer International Publishing :2025. - x, 141 p. :ill. (some col.), digital ;24 cm.

Radiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives.

Open access.

This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book.

ISBN: 9783031717239

Standard No.: 10.1007/978-3-031-71723-9doiSubjects--Topical Terms:

1530140
Electronic apparatus and appliances
--Effect of radiation on.

LC Class. No.: TK7870

Dewey Class. No.: 621.381

Single-event effects, from space to accelerator environments = analysis, prediction and hardening by design /
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505 0 $a Radiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives.
506 $a Open access.
520 $a This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book.
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