語系:
繁體中文
English
說明(常見問題)
回圖書館首頁
手機版館藏查詢
登入
回首頁
切換:
標籤
|
MARC模式
|
ISBD
An Analysis of Short Channel Effects...
~
Raveendran, Srividya.
FindBook
Google Book
Amazon
博客來
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation.
紀錄類型:
書目-電子資源 : Monograph/item
正題名/作者:
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation./
作者:
Raveendran, Srividya.
出版者:
Ann Arbor : ProQuest Dissertations & Theses, : 2023,
面頁冊數:
73 p.
附註:
Source: Masters Abstracts International, Volume: 84-12.
Contained By:
Masters Abstracts International84-12.
標題:
Electrical engineering. -
電子資源:
https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30418263
ISBN:
9798379699185
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation.
Raveendran, Srividya.
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation.
- Ann Arbor : ProQuest Dissertations & Theses, 2023 - 73 p.
Source: Masters Abstracts International, Volume: 84-12.
Thesis (M.S.)--University of Idaho, 2023.
This item must not be sold to any third party vendors.
The Gate All Around (GAA) Field Effect Transistor (FET) is a type of MOS (Metal Oxide Semiconductor) device that circumvents the problem of the existing FinFET devices and produces effective results on scaling up to 7nm technology node and beyond. The significant benefits of this transistor design are size reduction and increased potential for channel length scaling, which attributes to increased transistor density. However, there are some major challenges, like Short Channel Effects (SCE), which include Subthreshold Slope (SS), Drain Induced Barrier lowering (DIBL), and Gate Induced Drain Leakage (GIDL), that are involved in scaling. This paper mainly focuses on reviewing those challenges by analyzing the TCAD simulation results of two different types of GAA FET devices, Nanosheet (NS) and Nanowire (NW), along with the summary of the effect of the width and radius of NS and NW on the above- mentioned short channel effects. A comparative overview of the impact on a single and stacked device is also discussed.
ISBN: 9798379699185Subjects--Topical Terms:
649834
Electrical engineering.
Subjects--Index Terms:
Short Channel Effects
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation.
LDR
:02231nmm a2200397 4500
001
2395473
005
20240517104601.5
006
m o d
007
cr#unu||||||||
008
251215s2023 ||||||||||||||||| ||eng d
020
$a
9798379699185
035
$a
(MiAaPQ)AAI30418263
035
$a
AAI30418263
040
$a
MiAaPQ
$c
MiAaPQ
100
1
$a
Raveendran, Srividya.
$3
3764979
245
1 3
$a
An Analysis of Short Channel Effects in Gate All Around FET Devices, A TCAD Simulation.
260
1
$a
Ann Arbor :
$b
ProQuest Dissertations & Theses,
$c
2023
300
$a
73 p.
500
$a
Source: Masters Abstracts International, Volume: 84-12.
500
$a
Advisor: Li, Feng.
502
$a
Thesis (M.S.)--University of Idaho, 2023.
506
$a
This item must not be sold to any third party vendors.
520
$a
The Gate All Around (GAA) Field Effect Transistor (FET) is a type of MOS (Metal Oxide Semiconductor) device that circumvents the problem of the existing FinFET devices and produces effective results on scaling up to 7nm technology node and beyond. The significant benefits of this transistor design are size reduction and increased potential for channel length scaling, which attributes to increased transistor density. However, there are some major challenges, like Short Channel Effects (SCE), which include Subthreshold Slope (SS), Drain Induced Barrier lowering (DIBL), and Gate Induced Drain Leakage (GIDL), that are involved in scaling. This paper mainly focuses on reviewing those challenges by analyzing the TCAD simulation results of two different types of GAA FET devices, Nanosheet (NS) and Nanowire (NW), along with the summary of the effect of the width and radius of NS and NW on the above- mentioned short channel effects. A comparative overview of the impact on a single and stacked device is also discussed.
590
$a
School code: 0089.
650
4
$a
Electrical engineering.
$3
649834
650
4
$a
Materials science.
$3
543314
650
4
$a
Nanoscience.
$3
587832
653
$a
Short Channel Effects
653
$a
FET devices
653
$a
Metal Oxide Semiconductor
653
$a
Transistor design
653
$a
Subthreshold Slope
690
$a
0544
690
$a
0565
690
$a
0794
710
2
$a
University of Idaho.
$b
Electrical and Computer Engineering.
$3
2103966
773
0
$t
Masters Abstracts International
$g
84-12.
790
$a
0089
791
$a
M.S.
792
$a
2023
793
$a
English
856
4 0
$u
https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30418263
筆 0 讀者評論
館藏地:
全部
電子資源
出版年:
卷號:
館藏
1 筆 • 頁數 1 •
1
條碼號
典藏地名稱
館藏流通類別
資料類型
索書號
使用類型
借閱狀態
預約狀態
備註欄
附件
W9503793
電子資源
11.線上閱覽_V
電子書
EB
一般使用(Normal)
在架
0
1 筆 • 頁數 1 •
1
多媒體
評論
新增評論
分享你的心得
Export
取書館
處理中
...
變更密碼
登入