東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

Modeling and Characterization of CMO...

Abedi, Zahra.

Linked to FindBook

Google Book

Amazon

博客來

Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection./
Author:	Abedi, Zahra.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2023,
Description:	136 p.
Notes:	Source: Dissertations Abstracts International, Volume: 85-04, Section: B.
Contained By:	Dissertations Abstracts International85-04B.
Subject:	Electrical engineering. -
Online resource:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30421483
ISBN:	9798380606660

Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection.
Abedi, Zahra.

Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection. - Ann Arbor : ProQuest Dissertations & Theses, 2023 - 136 p.

Source: Dissertations Abstracts International, Volume: 85-04, Section: B.

Thesis (Ph.D.)--The University of New Mexico, 2023.

This item must not be sold to any third party vendors.

This research addresses the issue of electromagnetic interference (EMI) in digital electronics, which can cause undesired behavior in active electronic components and systems. As technology advances and transistor size decreases, devices become more susceptible to EMI. In addition, as voltage is scaled down to save energy, silicon chips become more susceptible to soft errors. While there are several ways to mitigate the impact of severe EMI on digital systems, minimal electromagnetic coupling can still cause significant problems. We develop analytical models to predict device upset due to EMI. The study focuses on identifying vulnerable parameters of operation related to device upsets under interference and investigating the correlation between upsets and interference characteristics, such as power and frequency, based on the device technology node. The predictive models are successfully compared against measurement data from devices that were fabricated using TSMC's 180 nm, 130 nm, and 65 nm standard CMOS processes which confirms their effectiveness in accurately predicting the system's behavior under low frequency RF injection.We first explore the impact of EMI on the leakage current of ICs, which is a major source of power dissipation. We found that even a small amount of EMI at low frequency can drastically increase leakage current, causing battery drainage and temperature rise, while the device appears to be operating normally. For example, a 340 mV of peak noise (or 0.6 dBm) can increase the leakage current by factor of 1000. We develop an analytic model to predict the inverter's leakage susceptibility as a function of the frequency and power of the injected EMI. The model successfully predicts the behavior of EMI injection on the leakage current in a CMOS inverter over a wide range of frequencies up to 4 GHz. As anticipated, the leakage current of the inverter increases as the amplitude of the RF signal increases. However, this change is relatively smaller at higher frequencies. Finally, we investigate the impact of RF injection on the eye height and signal-to-noise ratio (SNR) of a 10XINV, a fundamental element in digital circuits. The results show that RF injection causes significant degradation of the eye diagram, resulting in a reduction in the eye height and SNR values. For example, a peak noise of 251 mV (or -2 dBm) can lead to a nearly 50% reduction in eye height of 180 nm technology node.

ISBN: 9798380606660Subjects--Topical Terms:

649834
Electrical engineering.
Subjects--Index Terms:

Electromagnetic interference

Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection.
LDR:03713nmm a2200397 4500 001 2393619
005 20240414211454.5
006 m o d
007 cr#unu||||||||
008 251215s2023 ||||||||||||||||| ||eng d
020 $a 9798380606660
035 $a (MiAaPQ)AAI30421483
035 $a AAI30421483
040 $a MiAaPQ $c MiAaPQ
100 1 $a Abedi, Zahra. $3 3763089
245 1 0 $a Modeling and Characterization of CMOS Logic Gates Under Large Signal RF Injection.
260 1 $a Ann Arbor : $b ProQuest Dissertations & Theses, $c 2023
300 $a 136 p.
500 $a Source: Dissertations Abstracts International, Volume: 85-04, Section: B.
500 $a Advisor: Schamiloglu, Edl.
502 $a Thesis (Ph.D.)--The University of New Mexico, 2023.
506 $a This item must not be sold to any third party vendors.
520 $a This research addresses the issue of electromagnetic interference (EMI) in digital electronics, which can cause undesired behavior in active electronic components and systems. As technology advances and transistor size decreases, devices become more susceptible to EMI. In addition, as voltage is scaled down to save energy, silicon chips become more susceptible to soft errors. While there are several ways to mitigate the impact of severe EMI on digital systems, minimal electromagnetic coupling can still cause significant problems. We develop analytical models to predict device upset due to EMI. The study focuses on identifying vulnerable parameters of operation related to device upsets under interference and investigating the correlation between upsets and interference characteristics, such as power and frequency, based on the device technology node. The predictive models are successfully compared against measurement data from devices that were fabricated using TSMC's 180 nm, 130 nm, and 65 nm standard CMOS processes which confirms their effectiveness in accurately predicting the system's behavior under low frequency RF injection.We first explore the impact of EMI on the leakage current of ICs, which is a major source of power dissipation. We found that even a small amount of EMI at low frequency can drastically increase leakage current, causing battery drainage and temperature rise, while the device appears to be operating normally. For example, a 340 mV of peak noise (or 0.6 dBm) can increase the leakage current by factor of 1000. We develop an analytic model to predict the inverter's leakage susceptibility as a function of the frequency and power of the injected EMI. The model successfully predicts the behavior of EMI injection on the leakage current in a CMOS inverter over a wide range of frequencies up to 4 GHz. As anticipated, the leakage current of the inverter increases as the amplitude of the RF signal increases. However, this change is relatively smaller at higher frequencies. Finally, we investigate the impact of RF injection on the eye height and signal-to-noise ratio (SNR) of a 10XINV, a fundamental element in digital circuits. The results show that RF injection causes significant degradation of the eye diagram, resulting in a reduction in the eye height and SNR values. For example, a peak noise of 251 mV (or -2 dBm) can lead to a nearly 50% reduction in eye height of 180 nm technology node.
590 $a School code: 0142.
650 4 $a Electrical engineering. $3 649834
650 4 $a Electromagnetics. $3 3173223
650 4 $a Physical chemistry. $3 1981412
653 $a Electromagnetic interference
653 $a Digital electronics
653 $a Interference characteristics
653 $a Battery drainage
653 $a Signal-to-noise ratio
690 $a 0544
690 $a 0607
690 $a 0494
710 2 $a The University of New Mexico. $b Electrical Engineering. $3 3184238
773 0 $t Dissertations Abstracts International $g 85-04B.
790 $a 0142
791 $a Ph.D.
792 $a 2023
793 $a English
856 4 0 $u https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30421483