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Transmission electron microscopy sam...

Singh, Rajender.

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Transmission electron microscopy sample preparation = from specimen to micrograph /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Transmission electron microscopy sample preparation/ by Rajender Singh.
其他題名:	from specimen to micrograph /
作者:	Singh, Rajender.
出版者:	Cham :Springer Nature Switzerland : : 2024.,
面頁冊數:	xxiv, 317 p. :ill. (some col.), digital ;24 cm.
內容註:	Introduction to Transmission Electron Microscopy (TEM) -- Fundamentals of TEM Sample preparation -- Techniques for thin specimen from bulk Samples -- TEM Sample Preparation for Powder and Liquid formulations -- Sample Preparation for Soft Matters (Non Biological) and Biological Samples -- Introduction to cryo-TEM and related sample preparation -- In-situ TEM: Principle, Working, Application and Challenges -- Sample Preparation for Quantitative Analysis under TEM -- Correlative light and Electron Microscopy (CLEM) Sample Preparation -- Ideal TEM Imaging, analysis and Troubleshooting Tricks -- Unique case studies in TEM instrumentation, analysis and interpretation.
Contained By:	Springer Nature eBook
標題:	Transmission electron microscopy. -
電子資源:	https://doi.org/10.1007/978-3-031-82967-3
ISBN:	9783031829673

Transmission electron microscopy sample preparation = from specimen to micrograph /
Singh, Rajender.

Transmission electron microscopy sample preparationfrom specimen to micrograph /[electronic resource] :by Rajender Singh. - Cham :Springer Nature Switzerland :2024. - xxiv, 317 p. :ill. (some col.), digital ;24 cm.

Introduction to Transmission Electron Microscopy (TEM) -- Fundamentals of TEM Sample preparation -- Techniques for thin specimen from bulk Samples -- TEM Sample Preparation for Powder and Liquid formulations -- Sample Preparation for Soft Matters (Non Biological) and Biological Samples -- Introduction to cryo-TEM and related sample preparation -- In-situ TEM: Principle, Working, Application and Challenges -- Sample Preparation for Quantitative Analysis under TEM -- Correlative light and Electron Microscopy (CLEM) Sample Preparation -- Ideal TEM Imaging, analysis and Troubleshooting Tricks -- Unique case studies in TEM instrumentation, analysis and interpretation.

This book is a thorough guide tailored for researchers, academics, and practitioners immersed in the intricate world of Transmission Electron Microscopy (TEM). It offers a seamless blend of theoretical understanding and practical insights, providing readers with the essential skills to navigate the complexities of TEM sample preparation for optimal imaging. The book begins by introducing the basics of TEM operation, progressing to advanced modes, and dedicating significant attention to the nuances of sample preparation. Each chapter serves as a stepping stone, guiding readers from specimen selection to the acquisition of high-resolution micrographs. The motivation behind this book lies in addressing the practical challenges of TEM operation and sample preparation. The book bridges the gap between theory and application, offering a simplified yet scientific repository of dos and don'ts for achieving successful results in TEM sample preparation. Within these pages, readers will explore various thinning techniques, delve into the preparation of nanomaterials and biological samples, and grasp the intricacies of cryo-TEM and in-situ TEM. Along with troubleshooting guidance to common pitfalls, the book also provides practical tips for overcoming challenges in the sample preparation process. The book also addresses the importance of properly prepared TEM samples, emphasizing the often-underestimated role they play in unlocking the full potential of TEM imaging. Real-world case studies showcase the impact of high-quality sample preparation across diverse research fields. This book is not just an informative guide; it is a journey of transformation and enlightenment, empowering the reader with the confidence and expertise needed for precise sample preparation and quality imaging.

ISBN: 9783031829673

Standard No.: 10.1007/978-3-031-82967-3doiSubjects--Topical Terms:

567074
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

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520 $a This book is a thorough guide tailored for researchers, academics, and practitioners immersed in the intricate world of Transmission Electron Microscopy (TEM). It offers a seamless blend of theoretical understanding and practical insights, providing readers with the essential skills to navigate the complexities of TEM sample preparation for optimal imaging. The book begins by introducing the basics of TEM operation, progressing to advanced modes, and dedicating significant attention to the nuances of sample preparation. Each chapter serves as a stepping stone, guiding readers from specimen selection to the acquisition of high-resolution micrographs. The motivation behind this book lies in addressing the practical challenges of TEM operation and sample preparation. The book bridges the gap between theory and application, offering a simplified yet scientific repository of dos and don'ts for achieving successful results in TEM sample preparation. Within these pages, readers will explore various thinning techniques, delve into the preparation of nanomaterials and biological samples, and grasp the intricacies of cryo-TEM and in-situ TEM. Along with troubleshooting guidance to common pitfalls, the book also provides practical tips for overcoming challenges in the sample preparation process. The book also addresses the importance of properly prepared TEM samples, emphasizing the often-underestimated role they play in unlocking the full potential of TEM imaging. Real-world case studies showcase the impact of high-quality sample preparation across diverse research fields. This book is not just an informative guide; it is a journey of transformation and enlightenment, empowering the reader with the confidence and expertise needed for precise sample preparation and quality imaging.
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