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Electroless Deposition of CdTe on Stainless Steel 304 Substrates.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Electroless Deposition of CdTe on Stainless Steel 304 Substrates./
Author:	Malika, James Francis.
Published:	Ann Arbor : ProQuest Dissertations & Theses, : 2021,
Description:	102 p.
Notes:	Source: Masters Abstracts International, Volume: 83-02.
Contained By:	Masters Abstracts International83-02.
Subject:	Chemistry. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28678876
ISBN:	9798534683974

Electroless Deposition of CdTe on Stainless Steel 304 Substrates.
Malika, James Francis.

Electroless Deposition of CdTe on Stainless Steel 304 Substrates. - Ann Arbor : ProQuest Dissertations & Theses, 2021 - 102 p.

Source: Masters Abstracts International, Volume: 83-02.

Thesis (M.S.)--Youngstown State University, 2021.

This item must not be sold to any third party vendors.

The semiconductor cadmium telluride (CdTe) has become the leading material for thin-film photovoltaic applications. Among the many techniques for preparing these thin films, electroless deposition, commonly known as chemical bath deposition, deserves special focus since it has been shown to be a pollution-free, low-temperature and inexpensive method. In this project, CdTe thin films were deposited on stainless steel 304 by the electroless deposition method using cadmium acetate and tellurium oxide dissolved in pH 12.5 NH3(aq). The deposition was based on the gradual release of cadmium ions (Cd2+) and the gradual addition of tellurium as TeO32- and their subsequent reduction in a hot aqueous alkaline chemical bath at 70 °C. This was attained by adding a complexing agent such as ammonia and a chemical reducing agent. Using triethanolamine as a complexing agent produced similar results. The following reducing agents were used: aluminum, sodium hypophosphite, formaldehyde, sodium borohydride and hydrazine. All of them deposited a film on stainless steel containing Cd and Te, but formaldehyde produced the best films in terms of uniform thickness, photosensitivity, and rapid growth rate. Electroless deposition of a thin Pt layer on top of the CdTe film improved the cathodic CdTe polarization for hydrogen evolution. The structural and morphological properties of the resulting films were characterized using X-ray diffraction (XRD), stylus profilometry, scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) while the light/dark voltametric methods were used to determine the films' photosensitivity.

ISBN: 9798534683974Subjects--Topical Terms:

516420
Chemistry.
Subjects--Index Terms:

Renewable energy

Electroless Deposition of CdTe on Stainless Steel 304 Substrates.
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520 $a The semiconductor cadmium telluride (CdTe) has become the leading material for thin-film photovoltaic applications. Among the many techniques for preparing these thin films, electroless deposition, commonly known as chemical bath deposition, deserves special focus since it has been shown to be a pollution-free, low-temperature and inexpensive method. In this project, CdTe thin films were deposited on stainless steel 304 by the electroless deposition method using cadmium acetate and tellurium oxide dissolved in pH 12.5 NH3(aq). The deposition was based on the gradual release of cadmium ions (Cd2+) and the gradual addition of tellurium as TeO32- and their subsequent reduction in a hot aqueous alkaline chemical bath at 70 °C. This was attained by adding a complexing agent such as ammonia and a chemical reducing agent. Using triethanolamine as a complexing agent produced similar results. The following reducing agents were used: aluminum, sodium hypophosphite, formaldehyde, sodium borohydride and hydrazine. All of them deposited a film on stainless steel containing Cd and Te, but formaldehyde produced the best films in terms of uniform thickness, photosensitivity, and rapid growth rate. Electroless deposition of a thin Pt layer on top of the CdTe film improved the cathodic CdTe polarization for hydrogen evolution. The structural and morphological properties of the resulting films were characterized using X-ray diffraction (XRD), stylus profilometry, scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) while the light/dark voltametric methods were used to determine the films' photosensitivity.
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