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  • Cryogenic Transmission Electron Microscopy for Next-Generation Batteries.
  • 紀錄類型: 書目-電子資源 : Monograph/item
    正題名/作者: Cryogenic Transmission Electron Microscopy for Next-Generation Batteries./
    作者: Huang, William.
    出版者: Ann Arbor : ProQuest Dissertations & Theses, : 2021,
    面頁冊數: 193 p.
    附註: Source: Dissertations Abstracts International, Volume: 83-02, Section: B.
    Contained By: Dissertations Abstracts International83-02B.
    標題: Silicon. -
    電子資源: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=28483338
    ISBN: 9798505572047
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