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Theory and practice of thermal trans...

Rencz, M.

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Theory and practice of thermal transient testing of electronic components

Record Type:	Electronic resources : Monograph/item
Title/Author:	Theory and practice of thermal transient testing of electronic components/ edited by Marta Rencz, Gábor Farkas, András Poppe.
other author:	Rencz, M.
Published:	Cham :Springer International Publishing : : 2022.,
Description:	ix, 385 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements.
Contained By:	Springer Nature eBook
Subject:	Electronic apparatus and appliances - Testing. -
Online resource:	https://doi.org/10.1007/978-3-030-86174-2
ISBN:	9783030861742

Theory and practice of thermal transient testing of electronic components
Theory and practice of thermal transient testing of electronic components[electronic resource] /edited by Marta Rencz, Gábor Farkas, András Poppe. - Cham :Springer International Publishing :2022. - ix, 385 p. :ill., digital ;24 cm.

Introduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements.

This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices.

ISBN: 9783030861742

Standard No.: 10.1007/978-3-030-86174-2doiSubjects--Topical Terms:

672198
Electronic apparatus and appliances
--Testing.

LC Class. No.: TK7870 / .T44 2022

Dewey Class. No.: 621.381

Theory and practice of thermal transient testing of electronic components
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245 0 0 $a Theory and practice of thermal transient testing of electronic components $h [electronic resource] / $c edited by Marta Rencz, Gábor Farkas, András Poppe.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2022.
300 $a ix, 385 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction: the Importance and Motivation -- Theoretical Background: History, the Network Identification by Deconvolution (NID) Method, Structure Functions, the Thermal Signature -- The Use of Thermal Transient Testing -- General Practical Questions and the Flow of Thermal Transient Measurements -- On the Accuracy and Repeatability of Thermal Measurements.
520 $a This book discusses the major aspects of thermal transient testing, the most important method of thermal characterization of electronics available today. The book begins by presenting the theoretical background of creating structure functions from the measured results with mathematical details. It then moves on to show how the method can be used for thermal qualification, structure integrity testing, determining material parameters, and the calibration of simulation models. General practical questions about measurements are discussed to help beginners carry out thermal transient testing. The special problems and tricks of measuring with various electronic components, such as Si diodes, bipolar transistors, MOS transistors, IGBT devices, resistors, capacitors, wide band gap materials, and LEDs are covered in detail with the help of various use cases. This hands-on book will enable readers to accomplish thermal transient testing on any new type of electronics and provides the theoretical details needed to understand the opportunities and limitations offered by the methodology. The book will be an invaluable reference for practicing engineers, students, and researchers. The first book dedicated solely to thermal transient testing; Enables readers to accomplish thermal transient testing on any type of electronics; Provides valuable use cases and highlights the specialties of characterizing different devices.
650 0 $a Electronic apparatus and appliances $x Testing. $3 672198
650 1 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
650 2 4 $a Electrical Power Engineering. $3 3592498
650 2 4 $a Electronic Circuits and Systems. $3 3538814
650 2 4 $a Materials Engineering. $3 2071625
700 1 $a Rencz, M. $3 3614208
700 1 $a Farkas, Gabor. $3 3614209
700 1 $a Poppe, Andras. $3 2055060
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer Nature eBook
856 4 0 $u https://doi.org/10.1007/978-3-030-86174-2
950 $a Physics and Astronomy (SpringerNature-11651)