VLSI-SoC design trends = 28th IFIP W...
IFIP/IEEE International Conference on Very Large Scale Integration (2020 :)

Linked to FindBook      Google Book      Amazon      博客來     
  • VLSI-SoC design trends = 28th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2020, Salt Lake City, UT, USA, October 6-9, 2020 : revised and extended selected papers /
  • Record Type: Electronic resources : Monograph/item
    Title/Author: VLSI-SoC design trends/ edited by Andrea Calimera ... [et al.].
    Reminder of title: 28th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2020, Salt Lake City, UT, USA, October 6-9, 2020 : revised and extended selected papers /
    remainder title: VLSI-SoC 2020
    other author: Calimera, Andrea.
    corporate name: IFIP/IEEE International Conference on Very Large Scale Integration
    Published: Cham :Springer International Publishing : : 2021.,
    Description: xviii, 364 p. :ill., digital ;24 cm.
    [NT 15003449]: Low-Power High-Speed ADCs for ADC-Based Wireline Receivers in 22nm FDSOI -- A 125 pJ/b Mixed-Mode MCMC MIMO Detector with Relaxed DSP -- Low Power Current-Mode Relaxation Oscillators for Temperature and Supply Voltage Monitoring -- Fully-Autonomous SoC Synthesis using Customizable Cell-Based Analog and Mixed-signal Circuits Generation -- Assessing the Configuration Space of the Open Source NVDLA Deep Learning Accelerator on a Mainstream MPSoC Platform -- SAT-Based Mapping of Data-Flow Graph onto Coarse-Grained Reconfigurable Array -- Learning Based Timing Closure on Relative Timed Design -- Multilevel Signalling for High-Speed Chiplet-to-Chiplet Communication -- From Informal Specifications to an ABV Framework for Industrial Firmware Verification -- Modular Functional Testing: Targeting the Small Embedded Memories in GPUs -- RAT: A Lightweight Architecture Independent System-level Soft Error Mitigation Technique -- SANSCrypt: Sporadic-Authentication-Based Sequential Logic Encryption -- 3D Nanofabric: Layout Challenges and Solutions for Ultra-Scaled Logic Designs -- 3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model -- Statistical Array Allocation and Partitioning for Compute In-Memory Fabrics -- A Technology Backward-Compatible Compilation Flow for Processing-In-Memory.
    Contained By: Springer Nature eBook
    Subject: Integrated circuits - Congresses. - Very large scale integration -
    Online resource: https://doi.org/10.1007/978-3-030-81641-4
    ISBN: 9783030816414
Location:  Year:  Volume Number: 
Items
  • 1 records • Pages 1 •
 
W9403108 電子資源 11.線上閱覽_V 電子書 EB TK7874.75 .I45 2020 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
Multimedia
Reviews
Export
pickup library
 
 
Change password
Login