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Advanced computing in electron micro...

Kirkland, Earl J.

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Advanced computing in electron microscopy

Record Type:	Electronic resources : Monograph/item
Title/Author:	Advanced computing in electron microscopy/ by Earl J. Kirkland.
Author:	Kirkland, Earl J.
Published:	Cham :Springer International Publishing : : 2020.,
Description:	xii, 354 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
Contained By:	Springer eBooks
Subject:	Electron microscopy - Computer simulation. -
Online resource:	https://doi.org/10.1007/978-3-030-33260-0
ISBN:	9783030332600

Advanced computing in electron microscopy
Kirkland, Earl J.

Advanced computing in electron microscopy[electronic resource] /by Earl J. Kirkland. - Third edition. - Cham :Springer International Publishing :2020. - xii, 354 p. :ill., digital ;24 cm.

Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

ISBN: 9783030332600

Standard No.: 10.1007/978-3-030-33260-0doiSubjects--Topical Terms:

604047
Electron microscopy
--Computer simulation.

LC Class. No.: QH212.E4 / K575 2020

Dewey Class. No.: 570.2825

Advanced computing in electron microscopy
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100 1 $a Kirkland, Earl J. $3 1244839
245 1 0 $a Advanced computing in electron microscopy $h [electronic resource] / $c by Earl J. Kirkland.
250 $a Third edition.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a xii, 354 p. : $b ill., digital ; $c 24 cm.
505 0 $a Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
520 $a This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
650 0 $a Electron microscopy $x Computer simulation. $3 604047
650 1 4 $a Spectroscopy and Microscopy. $3 1066375
650 2 4 $a Image Processing and Computer Vision. $3 891070
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
650 2 4 $a Biological Microscopy. $3 890957
650 2 4 $a Spectroscopy/Spectrometry. $3 1084899
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
856 4 0 $u https://doi.org/10.1007/978-3-030-33260-0
950 $a Physics and Astronomy (Springer-11651)