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Iberoamerican Congress on Pattern Recognition (2017 :)

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Progress in pattern recognition, image analysis, computer vision, and applications = 22nd Iberoamerican Congress, CIARP 2017, Valparaiso, Chile, November 7-10, 2017 : proceedings /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Progress in pattern recognition, image analysis, computer vision, and applications/ edited by Marcelo Mendoza, Sergio Velastin.
Reminder of title:	22nd Iberoamerican Congress, CIARP 2017, Valparaiso, Chile, November 7-10, 2017 : proceedings /
remainder title:	CIARP 2017
other author:	Mendoza, Marcelo.
corporate name:	Iberoamerican Congress on Pattern Recognition
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xviii, 730 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Pattern recognition systems - Congresses. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-75193-1
ISBN:	9783319751931

Progress in pattern recognition, image analysis, computer vision, and applications = 22nd Iberoamerican Congress, CIARP 2017, Valparaiso, Chile, November 7-10, 2017 : proceedings /
Progress in pattern recognition, image analysis, computer vision, and applications22nd Iberoamerican Congress, CIARP 2017, Valparaiso, Chile, November 7-10, 2017 : proceedings /[electronic resource] :CIARP 2017edited by Marcelo Mendoza, Sergio Velastin. - Cham :Springer International Publishing :2018. - xviii, 730 p. :ill., digital ;24 cm. - Lecture notes in computer science,106570302-9743 ;. - Lecture notes in computer science ;10657..

This book constitutes the refereed post-conference proceedings of the 22nd Iberoamerican Congress on Pattern Recognition, CIARP 2017, held in Valparaiso, Chile, in November 2017. The 87 papers presented were carefully reviewed and selected from 156 submissions. The papers feature research results in the areas of pattern recognition, image processing, computer vision, multimedia and related fields.

ISBN: 9783319751931

Standard No.: 10.1007/978-3-319-75193-1doiSubjects--Topical Terms:

563039
Pattern recognition systems
--Congresses.

LC Class. No.: Q337.5

Dewey Class. No.: 006.4

Progress in pattern recognition, image analysis, computer vision, and applications = 22nd Iberoamerican Congress, CIARP 2017, Valparaiso, Chile, November 7-10, 2017 : proceedings /
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