東華大學圖書館 |

Language: English

Help

回圖書館首頁

手機版館藏查詢

Back

Switch To: Labeled | MARC Mode | ISBD

Ultra low noise CMOS image sensors

Boukhayma, Assim.

Linked to FindBook

Google Book

Amazon

博客來

Ultra low noise CMOS image sensors

Record Type:	Electronic resources : Monograph/item
Title/Author:	Ultra low noise CMOS image sensors/ by Assim Boukhayma.
Author:	Boukhayma, Assim.
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xiv, 180 p. :ill., digital ;24 cm.
[NT 15003449]:	Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
Contained By:	Springer eBooks
Subject:	Metal oxide semiconductors, Complementary. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-68774-2
ISBN:	9783319687742

Ultra low noise CMOS image sensors
Boukhayma, Assim.

Ultra low noise CMOS image sensors[electronic resource] /by Assim Boukhayma. - Cham :Springer International Publishing :2018. - xiv, 180 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

ISBN: 9783319687742

Standard No.: 10.1007/978-3-319-68774-2doiSubjects--Topical Terms:

649504
Metal oxide semiconductors, Complementary.

LC Class. No.: TK7871.99.M44

Dewey Class. No.: 621.367

Ultra low noise CMOS image sensors
LDR:02274nmm a2200337 a 4500 001 2132252
003 DE-He213
005 20180719105041.0
006 m d
007 cr nn 008maaau
008 181005s2018 gw s 0 eng d
020 $a 9783319687742 $q (electronic bk.)
020 $a 9783319687735 $q (paper)
024 7 $a 10.1007/978-3-319-68774-2 $2 doi
035 $a 978-3-319-68774-2
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7871.99.M44
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TEC008070 $2 bisacsh
082 0 4 $a 621.367 $2 23
090 $a TK7871.99.M44 $b B762 2018
100 1 $a Boukhayma, Assim. $3 3298592
245 1 0 $a Ultra low noise CMOS image sensors $h [electronic resource] / $c by Assim Boukhayma.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xiv, 180 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer theses, $x 2190-5053
505 0 $a Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
520 $a This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
650 0 $a Metal oxide semiconductors, Complementary. $3 649504
650 0 $a Image processing $x Digital techniques. $3 532550
650 1 4 $a Engineering. $3 586835
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 893838
650 2 4 $a Signal, Image and Speech Processing. $3 891073
650 2 4 $a Circuits and Systems. $3 896527
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a Springer theses. $3 1314442
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-68774-2
950 $a Engineering (Springer-11647)