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Scanning electron microscopy and x-r...

Goldstein, Joseph I.

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Scanning electron microscopy and x-ray microanalysis

Record Type:	Electronic resources : Monograph/item
Title/Author:	Scanning electron microscopy and x-ray microanalysis/ by Joseph I. Goldstein ... [et al.].
other author:	Goldstein, Joseph I.
Published:	New York, NY :Springer New York : : 2018.,
Description:	xxiii, 550 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.
Contained By:	Springer eBooks
Subject:	Scanning electron microscopy. -
Online resource:	http://dx.doi.org/10.1007/978-1-4939-6676-9
ISBN:	9781493966769

Scanning electron microscopy and x-ray microanalysis
Scanning electron microscopy and x-ray microanalysis[electronic resource] /by Joseph I. Goldstein ... [et al.]. - 4th ed. - New York, NY :Springer New York :2018. - xxiii, 550 p. :ill. (some col.), digital ;24 cm.

Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.

ISBN: 9781493966769

Standard No.: 10.1007/978-1-4939-6676-9doiSubjects--Topical Terms:

551366
Scanning electron microscopy.

LC Class. No.: QH212.S3

Dewey Class. No.: 502.825

Scanning electron microscopy and x-ray microanalysis
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245 0 0 $a Scanning electron microscopy and x-ray microanalysis $h [electronic resource] / $c by Joseph I. Goldstein ... [et al.].
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260 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2018.
300 $a xxiii, 550 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam - Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix - A Database of Electron-Solid Interactions -- Index.
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650 2 4 $a Characterization and Evaluation of Materials. $3 890988
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650 2 4 $a Biological Microscopy. $3 890957
650 2 4 $a Spectroscopy/Spectrometry. $3 1084899
650 2 4 $a Measurement Science and Instrumentation. $3 1066390
700 1 $a Goldstein, Joseph I. $3 3298243
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