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EM material characterization techniques for metamaterials
Record Type:
Electronic resources : Monograph/item
Title/Author:
EM material characterization techniques for metamaterials/ by Raveendranath U. Nair ... [et al.].
other author:
Nair, Raveendranath U.
Published:
Singapore :Springer Singapore : : 2018.,
Description:
xxiii, 50 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Metamaterials. -
Online resource:
http://dx.doi.org/10.1007/978-981-10-6517-0
ISBN:
9789811065170
EM material characterization techniques for metamaterials
EM material characterization techniques for metamaterials
[electronic resource] /by Raveendranath U. Nair ... [et al.]. - Singapore :Springer Singapore :2018. - xxiii, 50 p. :ill., digital ;24 cm. - SpringerBriefs in electrical and computer engineering,2191-8112. - SpringerBriefs in electrical and computer engineering..
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.
ISBN: 9789811065170
Standard No.: 10.1007/978-981-10-6517-0doiSubjects--Topical Terms:
1066595
Metamaterials.
LC Class. No.: TK7871.15.M48 / E5 2018
Dewey Class. No.: 620.11
EM material characterization techniques for metamaterials
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This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials.
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Engineering (Springer-11647)
based on 0 review(s)
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W9340012
電子資源
11.線上閱覽_V
電子書
EB TK7871.15.M48 E5 2018
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