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The investigation of plastic behavio...
~
Cui, Yinan.
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The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
Record Type:
Electronic resources : Monograph/item
Title/Author:
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale/ by Yinan Cui.
Author:
Cui, Yinan.
Published:
Singapore :Springer Singapore : : 2017.,
Description:
xiv, 131 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Dislocations in crystals. -
Online resource:
http://dx.doi.org/10.1007/978-981-10-3032-1
ISBN:
9789811030321
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
Cui, Yinan.
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
[electronic resource] /by Yinan Cui. - Singapore :Springer Singapore :2017. - xiv, 131 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..
This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
ISBN: 9789811030321
Standard No.: 10.1007/978-981-10-3032-1doiSubjects--Topical Terms:
652801
Dislocations in crystals.
LC Class. No.: QD921
Dewey Class. No.: 548.842
The investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale
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This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin of several new phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning.
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based on 0 review(s)
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電子資源
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Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
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Opac note
Attachments
W9314372
電子資源
11.線上閱覽_V
電子書
EB QD921
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1 records • Pages 1 •
1
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